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1. (WO2018161210) DEVICE AND METHOD FOR TESTING FINGERPRINT CHIP

Pub. No.:    WO/2018/161210    International Application No.:    PCT/CN2017/075744
Publication Date: Fri Sep 14 01:59:59 CEST 2018 International Filing Date: Tue Mar 07 00:59:59 CET 2017
IPC: H01L 23/31
B65D 77/26
Applicants: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
深圳市汇顶科技股份有限公司
Inventors: LI, Liang
李亮
JIANG, Jianwei
江建威
XIAO, Yuquan
肖裕权
Title: DEVICE AND METHOD FOR TESTING FINGERPRINT CHIP
Abstract:
Disclosed are a device (100) for testing a fingerprint chip and a method for testing a fingerprint chip, allowing testing of an entire substrate of fingerprint chips. The device (100) for testing a fingerprint chip comprises: a cover plate (110), an outer ring of the cover plate (110) being a first trapezoidal structure (111), and a main part of the cover plate (110) being provided with a recessed structure (112) being a grid of M rows and N columns, wherein M and N are positive integers; a tray (120), an inner ring of the tray (120) being a second trapezoidal structure (121), a main part of the tray (120) being provided with a recessed structure (122) being a grid of A rows and B columns, wherein A and B are positive integers. When the cover plate (110) is closed, there is an anti-cracking space (20) between the first trapezoidal structure (111) and the second trapezoidal structure (121), the height of the anti-cracking space (20) being greater than the thickness of the entire substrate of fingerprint chips. The cover plate (110) and the tray (120) are used to fix the entire substrate of fingerprint chips in the anti-cracking space (20) when the cover plate (110) is closed.