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1. (WO2018161144) AIRCRAFT STATIC TEST FOR PITOT STATIC SYSTEM
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/161144 International Application No.: PCT/CA2017/050325
Publication Date: 13.09.2018 International Filing Date: 10.03.2017
IPC:
G01P 21/00 (2006.01) ,B64F 5/60 (2017.01) ,G01C 25/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION OR SHOCK; INDICATING PRESENCE OR ABSENCE OF MOVEMENT;  INDICATING DIRECTION OF MOVEMENT 
21
Testing or calibrating of apparatus or devices covered by the other groups of this subclass
[IPC code unknown for B64F 5/60]
G PHYSICS
01
MEASURING; TESTING
C
MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
25
Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
Applicants:
NAV-AIDS LTD [CA/CA]; 2955 rue Diab Montréal, Québec H4S 1M1, CA
Inventors:
GILDAY, Brent Duncan; CA
SINNOTT, Van Jean; CA
Agent:
ANGLEHART ET AL.; 1939 de Maisonneuve Ouest Montreal, Québec H3H 1K3, CA
ANGLEHART, James; CA
Priority Data:
Title (EN) AIRCRAFT STATIC TEST FOR PITOT STATIC SYSTEM
(FR) TEST STATIQUE D’AÉRONEF POUR SYSTÈME STATIQUE DE PITOT
Abstract:
(EN) An aircraft static test adapter assembly comprising a static test head for performing testing at an aircraft static port on an aircraft body. The static test head is biased, and optionally supported by a biasing member extending in use from the static test head to the ground. A biasing mechanism provides a biasing force to the biasing member which is transferred by the biasing member to the static test head such that it is held in place. Abstract not intended to be limiting.
(FR) L’invention concerne un ensemble adaptateur de test statique d’aéronef comprenant une tête de test statique servant à effectuer des tests au niveau d’un port statique d’aéronef d’un corps d’aéronef. La tête de test statique est sollicitée, et éventuellement supportée par un élément de sollicitation s’étendant lors de l’utilisation entre la tête de test statique et le sol. Un mécanisme de sollicitation fournit une force de sollicitation à l’élément de sollicitation, qui est transférée par l’élément de sollicitation sur la tête de test statique de façon à la maintenir en place. Cet abrégé n’est pas destiné à être limitatif.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)