Search International and National Patent Collections
|1. (WO2018159825) INSPECTION SYSTEM AND INSPECTION METHOD|
|Applicants:||RICOH ELEMEX CORPORATION
KOCHI PREFECTURAL PUBLIC UNIVERSITY CORPORATION
|Title:||INSPECTION SYSTEM AND INSPECTION METHOD|
The inspection system according to an embodiment of the present invention is provided with: an illumination unit for sequentially switching and outputting a plurality of stripe patterns so that after a first stripe pattern has moved for a single period, a second stripe pattern seamlessly moves for a single period; a first signal output unit for outputting a first signal as a trigger for starting output of the plurality of stripe patterns to the illumination unit; a second signal output unit for outputting a second signal as a trigger for switching the plurality of stripe patterns to the illumination unit; an image data acquiring unit for acquiring time correlation image data by starting superposition of frames at a timing based on the first signal, the frames being outputted from an image sensor; an image generating unit for generating a first time correlation image corresponding to only the first stripe pattern and a second time correlation image corresponding to only the second stripe pattern on the basis of the time correlation image data; and a fault detection unit for detecting a fault in an inspection object surface on the basis of the first time correlation image and the second time correlation image.