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1. WO2018154924 - MICROSCOPIC DEVICE, OBSERVATION METHOD, AND CONTROL PROGRAM FOR MICROSCOPIC DEVICE

Publication Number WO/2018/154924
Publication Date 30.08.2018
International Application No. PCT/JP2017/044456
International Filing Date 12.12.2017
IPC
G02B 21/00 2006.1
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
G02B 7/28 2006.1
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
7Mountings, adjusting means, or light-tight connections, for optical elements
28Systems for automatic generation of focusing signals
CPC
G02B 21/0036
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
0004specially adapted for specific applications
002Scanning microscopes
0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
0036Scanning details, e.g. scanning stages
G02B 21/006
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
0004specially adapted for specific applications
002Scanning microscopes
0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
0052Optical details of the image generation
006focusing arrangements; selection of the plane to be imaged
G02B 21/02
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
02Objectives
G02B 21/241
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
241Devices for focusing
G02B 21/244
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
241Devices for focusing
244using image analysis techniques
G02B 21/245
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
24Base structure
241Devices for focusing
245using auxiliary sources, detectors
Applicants
  • 富士フイルム株式会社 FUJIFILM CORPORATION [JP]/[JP]
Inventors
  • 松原 兼太 MATSUBARA Kenta
Agents
  • 中島 順子 NAKASHIMA Junko
  • 米倉 潤造 YONEKURA Junzo
  • 村上 泰規 MURAKAMI Yasunori
Priority Data
2017-03468027.02.2017JP
Publication Language Japanese (ja)
Filing Language Japanese (JA)
Designated States
Title
(EN) MICROSCOPIC DEVICE, OBSERVATION METHOD, AND CONTROL PROGRAM FOR MICROSCOPIC DEVICE
(FR) DISPOSITIF MICROSCOPIQUE, PROCÉDÉ D'OBSERVATION, ET PROGRAMME DE COMMANDE POUR DISPOSITIF MICROSCOPIQUE
(JA) 顕微鏡装置および観察方法並びに顕微鏡装置制御プログラム
Abstract
(EN) The present invention provides a microscopic device, an observation method, and a control program for a microscopic device that are capable of more efficiently controlling autofocus and reducing the imaging time when scanning a culture vessel with an optical imaging system and controlling the autofocus at each observation position. A first displacement sensor (18a) and a second displacement sensor (18b) detect the focus information for a culture vessel (50) while a stage (51) moves from an initial position (P1) to a scanning and measurement position (P2). When the stage (51) moves to the scanning and measurement position (P2), an autofocus control unit controls the autofocus at each observation position on the basis of the focus information.
(FR) La présente invention concerne un dispositif microscopique, un procédé d'observation et un programme de commande pour un dispositif microscopique, qui sont capables de commander de manière plus efficiente la mise au point automatique et de réduire le temps d'imagerie lorsqu'un récipient de culture est balayé à l'aide d'un système d'imagerie optique en commandant la mise au point automatique à chaque position d'observation. Un premier capteur (18a) de déplacement et un second capteur (18b) de déplacement détectent les informations de mise au point pour un récipient de culture (50) tandis qu'une platine (51) se déplace d'une position initiale (P1) à une position (P2) de balayage et de mesure. Lorsque la platine (51) se déplace jusqu'à la position (P2) de balayage et de mesure, une unité de commande de mise au point automatique commande la mise au point automatique à chaque position d'observation d'après les informations de mise au point.
(JA) 培養容器を結像光学系によって走査し、各観察位置においてオートフォーカス制御を行う場合において、オートフォーカス制御をより効率的に行い、撮影時間の短縮を図ることができる顕微鏡装置および観察方法並びに顕微鏡装置制御プログラムを提供する。ステージ(51)が初期セット位置(P1)から走査計測位置(P2)まで移動する間に、培養容器(50)のフォーカス情報を第1の変位センサ(18a)および第2の変位センサ(18b)によって検出し、オートフォーカス制御部が、ステージ(51)が走査計測位置(P2)に移動した際、フォーカス情報に基づいて、観察位置毎のオートフォーカス制御を行う。
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