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1. (WO2018146748) TESTING DEVICE AND TESTING METHOD FOR DC CIRCUIT BREAKER
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Pub. No.: WO/2018/146748 International Application No.: PCT/JP2017/004561
Publication Date: 16.08.2018 International Filing Date: 08.02.2017
IPC:
G01R 31/327 (2006.01) ,G01R 31/333 (2006.01) ,H01H 33/59 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
327
Testing of circuit interrupters, switches or circuit-breakers
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
327
Testing of circuit interrupters, switches or circuit-breakers
333
Testing of the switching capacity of high-voltage circuit-breakers
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
H
ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
33
High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
02
Details
59
Circuit arrangements not adapted to a particular application of the switch and not otherwise provided for, e.g. for ensuring operation of the switch at a predetermined point in the ac cycle
Applicants:
三菱電機株式会社 MITSUBISHI ELECTRIC CORPORATION [JP/JP]; 東京都千代田区丸の内二丁目7番3号 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310, JP
Inventors:
稲垣 卓志 INAGAKI, Takashi; JP
常世田 翔 TOKOYODA, Sho; JP
亀井 健次 KAMEI, Kenji; JP
宮下 信 MIYASHITA, Makoto; JP
Agent:
高村 順 TAKAMURA, Jun; JP
Priority Data:
Title (EN) TESTING DEVICE AND TESTING METHOD FOR DC CIRCUIT BREAKER
(FR) DISPOSITIF DE TEST ET PROCÉDÉ DE TEST POUR DISJONCTEUR CC
(JA) 直流遮断器の試験装置及び試験方法
Abstract:
(EN) This testing device (100) for a DC circuit breaker is provided with: an AC power supply (1) for generating a testing current to apply to a DC circuit-breaking device (5) for testing, which includes a DC circuit breaker (6) to be tested; an auxiliary circuit breaker (4) that is provided between the AC power supply (1) and DC circuit-breaking device (5) and cuts off the testing current flowing from the AC power supply (1) to the DC circuit-breaking device (5); and a control device for controlling the operation of the AC power supply (1), DC circuit breaker (6), and auxiliary circuit breaker (4). The control device outputs an opening command to the auxiliary circuit breaker (4) within the time range in which a voltage greater than or equal to that required for testing can be obtained as the recovery voltage after the cutting off of the DC circuit breaker (6).
(FR) L'invention concerne un dispositif de test (100) d'un disjoncteur CC comprenant : une alimentation CA (1) permettant de générer un courant de test à appliquer à un dispositif disjoncteur CC (5) pour un test, qui comprend un disjoncteur CC (6) à tester ; un disjoncteur auxiliaire (4) situé entre l'alimentation CA (1) et un dispositif disjoncteur CC (5) et qui coupe le courant de test circulant depuis l'alimentation CA (1) jusqu'au dispositif disjoncteur CC (5) ; et un dispositif de commande permettant de commander le fonctionnement de l'alimentation CA (1), du disjoncteur CC (6) et du disjoncteur auxiliaire (4). Le dispositif de commande émet en sortie une commande d'ouverture au disjoncteur auxiliaire (4) dans la plage temporelle dans laquelle une tension supérieure ou égale à la tension exigée pour le test peut être obtenue en tant que tension de récupération après la coupure du disjoncteur CC (6).
(JA) 直流遮断器の試験装置(100)は、試験対象の直流遮断器(6)を含む供試用の直流遮断装置(5)に流す試験電流を生成する交流電源(1)と、交流電源(1)と直流遮断装置(5)との間に設けられ、交流電源(1)から直流遮断装置(5)に流れる試験電流を遮断する補助遮断器(4)と、交流電源(1)、直流遮断器(6)及び補助遮断器(4)の動作を制御する制御装置と、を備える。制御装置は、直流遮断器(6)を遮断した後の回復電圧が試験責務上必要とされる電圧以上が得られる時刻の範囲内で補助遮断器(4)に開極指示を出力する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)