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1. (WO2018143668) ELEMENT SORTING DEVICE
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Pub. No.: WO/2018/143668 International Application No.: PCT/KR2018/001338
Publication Date: 09.08.2018 International Filing Date: 31.01.2018
IPC:
G01R 31/28 (2006.01)
[IPC code unknown for G01R 31/28]
Applicants:
(주)제이티 JT CORPORATION [KR/KR]; 충청남도 천안시 서북구 직산읍 4산단3로 135 135, 4sandan 3-ro, Jiksan-eup, Seobuk-gu, Cheonan-si, Chungcheongnam-do 31040, KR
Inventors:
유홍준 YOU, Hong Jun; KR
Agent:
특허법인주원 B&IP-JOOWON PATENT AND LAW FIRM; 서울시 강남구 언주로 711, 건설회관 9층 (논현동) (Nonhyeon-dong) 9th Floor, Construction Center, Eonju-ro 711, Gangnam-gu, Seoul 06050, KR
Priority Data:
10-2017-001363031.01.2017KR
Title (EN) ELEMENT SORTING DEVICE
(FR) DISPOSITIF DE TRI D'ÉLÉMENTS
(KO) 소자소팅장치
Abstract:
(EN) The present invention relates to an element sorting device and, more particularly, to an element sorting device for automatically sorting elements, such as semiconductor chips, according to a sorting standard. The present provides an element sorting device characterized by comprising: a loading portion (100) for loading a tray (30) on which elements (10) to be inspected are stacked; a DC test portion (170) for receiving the elements (10) to be inspected from the loading portion (100) and performing a DC test; an X-Y table (410) for moving a burn-in board (20) in X-Y direction, the burn-in board (20) being configured such that elements (10) to be inspected, which have been confirmed as acceptable as a result of a test by the DC test portion (170), are stacked in an empty place from which elements (10) to be sorted have been withdrawn; an unloading portion (300) for stacking elements (10) to be sorted, which have been withdrawn from the burn-in board (20), on a tray (30) corresponding to a corresponding sorting standard according to a preset sorting standard; a first buffer tray portion (610) installed to enable the tray (30) to move to a stacking position above the DC test portion (170) and to an avoidance position spaced from the stacking position in the horizontal direction such that elements (10) confirmed as nonacceptable as a result of a DC test by the DC test portion (170) are temporarily stacked on the tray (30); and a second buffer tray portion (620) positioned between a position of withdrawal of elements (10) with regard to the burn-in board (20) and the unloading portion (300) so as to temporarily stack elements (10) that are to be sorted as belonging to a sorting class other than acceptable classes among the elements (10) to be sorted, which have been withdrawn from the burn-in board (20).
(FR) La présente invention concerne un dispositif de tri d'éléments et plus particulièrement un dispositif de tri d'éléments permettant le tri automatique d'éléments, tels que des puces semi-conductrices, conformément à une norme de tri. La présente invention concerne un dispositif de tri d'éléments comprenant : une partie chargement (100) permettant de charger un plateau (30) sur lequel des éléments (10) à inspecter sont empilés ; une partie test CC (170) permettant de recevoir les éléments (10) à inspecter en provenance de la partie chargement (100) et d'effectuer un test CC ; une table X-Y (410) permettant de déplacer une carte de vieillissement artificiel (20) dans la direction X-Y, la carte de vieillissement artificiel (20) étant conçue de telle sorte que des éléments (10) à inspecter, ayant été confirmés comme acceptables suite à un test par la partie test CC (170), soient empilés dans un emplacement vide duquel des éléments (10) à trier ont été retirés ; une partie déchargement (300) permettant d'empiler des éléments (10) à trier ayant été retirés de la carte de vieillissement artificiel (20), sur un plateau (30) correspondant à une norme de tri correspondante conformément à une norme de tri prédéfinie ; une première partie plateau tampon (610) installée afin de permettre au plateau (30) de se déplacer vers une position d'empilement au-dessus de la partie test CC (170) et vers une position d'évitement espacée de la position d'empilement dans la direction horizontale de telle sorte que des éléments (10) confirmés comme non acceptables suite à un test CC par la partie test CC (170) soient temporairement empilés sur le plateau (30) ; et une seconde partie plateau tampon (620) positionnée entre une position de retrait d'éléments (10) par rapport à la carte de vieillissement artificiel (20) et la partie déchargement (300) de façon à empiler temporairement des éléments (10) devant être triés comme appartenant à une classe de tri autre que des classes acceptables parmi les éléments (10) à trier, ayant été retirés de la carte de vieillissement artificiel (20).
(KO) 본 발명은 소자소팅장치에 관한 것으로서, 보다 상세하게는 반도체칩과 같은 소자를 분류기준에 따라서 자동으로 분류하는 소자소팅장치에 관한 것이다. 본 발명은, 검사될 소자(10)들이 적재된 트레이(30)가 로딩되는 로딩부(100)와; 상기 로딩부(100)로부터 검사될 소자(10)들을 전달받아 DC테스트를 수행하는 DC테스트부(170)와; 분류될 소자(10)들이 인출된 빈 자리에 상기 DC테스트부(170)에서 양품으로 테스트된 검사될 소자(10)가 적재되는 번인보드(20)를 X-Y방향으로 이동시키는 X-Y테이블(410)과; 상기 번인보드(20)로부터 인출된 분류될 소자(10)가 미리 설정된 분류기준에 따라서 해당 분류기준에 대응되는 트레이(30)에 적재되는 언로딩부(300)와; 상기 DC테스트부(170)의 상측의 적재위치 및 상기 적재위치로부터 수평방향으로 이격된 회피위치로 트레이(30)가 이동가능하게 설치되어 상기 트레이(30)에 상기 DC테스트부(170)의 DC테스트 결과 불량으로 검사된 소자(10)들이 임시로 적재되는 제1버퍼트레이부(610)와; 상기 번인보드(20)에 대한 소자(10)의 인출위치 및 상기 언로딩부(300) 사이에 위치되어 상기 번인보드(20)로부터 인출된 분류될 소자(10)들 중 양품 이외의 분류등급으로 분류될 소자(10)를이 임시로 적재되는 제2버퍼트레이부(620)를 포함하는 것을 특징으로 하는 소자소팅장치를 개시한다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)