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1. WO2018143577 - TEST PROBE AND TEST SOCKET USING THE SAME

Publication Number WO/2018/143577
Publication Date 09.08.2018
International Application No. PCT/KR2018/000521
International Filing Date 11.01.2018
IPC
G01R 1/067 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
G01R 31/28 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 1/0416
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0416Connectors, terminals
G01R 1/06722
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06716Elastic
06722Spring-loaded
G01R 1/06738
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06733Geometry aspects
06738related to tip portion
G01R 31/2808
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Applicants
  • LEENO INDUSTRIAL INC. [KR]/[KR]
Inventors
  • BAEK, Seung-ha
Agents
  • HUH, Sung-Won
  • SEO, Dong-heon
  • LEE, Dong-uk
Priority Data
10-2017-001515302.02.2017KR
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) TEST PROBE AND TEST SOCKET USING THE SAME
(FR) SONDE DE TEST ET PRISE DE TEST UTILISANT CETTE DERNIÈRE
Abstract
(EN) Disclosed is a test probe for an object with a barrel-shaped contact terminal having a curved surface. The test probe includes a first contact member configured to comprise a contact portion having a pair of contact surfaces which are arranged in a form of 'V' and respectively contact the contact terminal to be tested at points spaced from each other, and an extended portion integrally extended from the contact portion backward in a lengthwise direction. Thus, the test probe can effectively contacts a partially curved barrel-shaped contact terminal of an object to be tested, such as a subminiature camera module for a smart phone.
(FR) La présente invention concerne une sonde de test pour un objet ayant une borne de contact en forme de cylindre ayant une surface incurvée. La sonde de test comprend un premier élément de contact configuré de sorte à comprendre une partie de contact ayant une paire de surfaces de contact qui sont agencées sous la forme d'un « V » et venir en contact respectivement avec la borne de contact à tester à des points espacés les uns des autres, et une partie étendue s'étendant d'un seul tenant à partir de la partie de contact vers l'arrière dans une direction longitudinale. Ainsi, la sonde de test peut entrer en contact de manière efficace avec une borne de contact en forme de cylindre partiellement incurvée d'un objet à tester, tel qu'un module de caméra subminiature pour un téléphone intelligent.
Related patent documents
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