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1. WO2018143092 - MEASUREMENT DEVICE

Publication Number WO/2018/143092
Publication Date 09.08.2018
International Application No. PCT/JP2018/002510
International Filing Date 26.01.2018
IPC
G01S 7/481 2006.1
GPHYSICS
01MEASURING; TESTING
SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
7Details of systems according to groups G01S13/, G01S15/, G01S17/127
48of systems according to group G01S17/58
481Constructional features, e.g. arrangements of optical elements
G01C 3/06 2006.1
GPHYSICS
01MEASURING; TESTING
CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
3Measuring distances in line of sight; Optical rangefinders
02Details
06Use of electric means to obtain final indication
G02B 26/10 2006.1
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
26Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating or modulating
08for controlling the direction of light
10Scanning systems
CPC
G01C 3/06
GPHYSICS
01MEASURING; TESTING
CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
3Measuring distances in line of sight; Optical rangefinders
02Details
06Use of electric means to obtain final indication
G01S 7/481
GPHYSICS
01MEASURING; TESTING
SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
7Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
48of systems according to group G01S17/00
481Constructional features, e.g. arrangements of optical elements
G02B 26/10
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
26Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating
08for controlling the direction of light
10Scanning systems
Applicants
  • パイオニア株式会社 PIONEER CORPORATION [JP]/[JP]
Inventors
  • 棚橋 祥夫 TANAHASHI, Yasuo
Agents
  • 中村 聡延 NAKAMURA, Toshinobu
Priority Data
2017-01508131.01.2017JP
Publication Language Japanese (ja)
Filing Language Japanese (JA)
Designated States
Title
(EN) MEASUREMENT DEVICE
(FR) DISPOSITIF DE MESURE
(JA) 計測装置
Abstract
(EN) A measurement device 100 has a MEMS mirror 4 for radiating projection light L1 while changing the radiating direction thereof, a light-receiving part 3 for receiving return light L2 reflected by a measurement object 10 included on a surface scanned by the projection light L1 radiated by the MEMS mirror 4, and an optical member 5 for reflecting the projection light L1 and the return light L2. Here, the optical member 5 reflects the projection light L1 radiated by the MEMS mirror 4 in a second period so that a region (first region) of the measurement object 10 irradiated by the projection light L1 in a first period within a first cycle and a region (second region) of the measurement object 10 irradiated by the projection light L1 radiated by the MEMS mirror 4 in a second period at least partially overlap.
(FR) L'invention concerne un dispositif de mesure (100) possédant un miroir MEMS (4) permettant d'émettre le rayonnement d'une lumière de projection (L1) tout en changeant la direction de rayonnement de cette dernière, une partie réception de lumière (3) permettant de recevoir une lumière de retour (L2) réfléchie par un objet de mesure (10) inclus sur une surface balayée par la lumière de projection (L1) dont le rayonnement est émis par le miroir MEMS (4) et un élément optique (5) permettant de réfléchir la lumière de projection (L1) et la lumière de retour (L2). Ici, l'élément optique (5) réfléchit la lumière de projection (L1) dont le rayonnement est émis par le miroir MEMS (4) dans une seconde période de sorte qu'une zone (première zone) de l'objet de mesure (10) exposée à la lumière de projection (L1) dans une première période à l'intérieur d'un premier cycle et qu'une zone (seconde zone) de l'objet de mesure (10) exposée à la lumière de projection (L1) dont le rayonnement est émis par le miroir MEMS (4) dans une seconde période se chevauchent au moins partiellement.
(JA) 計測装置100は、照射方向を変えながら投射光L1を照射するMEMSミラー4と、MEMSミラー4によって照射された投射光L1による走査面に含まれる計測対象物10によって反射された戻り光L2を受光する受光部3と、投射光L1及び戻り光L2を反射する光学部材5とを有する。ここで、光学部材5は、1周期内における第1期間に投射光L1が照射される計測対象物10の領域(第1領域)と、第2期間にMEMSミラー4によって照射された投射光L1が照射される計測対象物10の領域(第2領域)との少なくとも一部が重なるように、第2期間にMEMSミラー4によって照射された投射光L1を反射する。
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