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1. WO2018141967 - SAMPLE HOLDER

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Publication Number WO/2018/141967
Publication Date 09.08.2018
International Application No. PCT/EP2018/052820
International Filing Date 05.02.2018
IPC
G01N 23/223 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
22by measuring secondary emission from the material
223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
CPC
E21B 49/00
EFIXED CONSTRUCTIONS
21EARTH DRILLING; MINING
BEARTH DRILLING, e.g. DEEP DRILLING
49Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
G01N 2223/03
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
03by transmission
G01N 2223/076
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
07secondary emission
076X-ray fluorescence
G01N 2223/307
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
30Accessories, mechanical or electrical features
307cuvettes-sample holders
G01N 23/20025
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
20025Sample holders or supports therefor
G01N 23/2204
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
22by measuring secondary emission from the material
2204Specimen supports therefor; Sample conveying means therefore
Applicants
  • OREXPLORE AB [SE]/[SE]
Inventors
  • HANSSON, Alexander
  • BERGQVIST, Mikael
Agents
  • AWA SWEDEN AB
Priority Data
1750098-406.02.2017SE
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) SAMPLE HOLDER
(FR) PORTE-ÉCHANTILLON
front page image
Abstract
(EN) A sample holder for holding a sample comprising a drill core sample or drill cuttings during X-ray transmission measurements and fluorescence measurements is disclosed. The sample holder comprises a confining structure having an axial direction and being adapted to, during measurement, at least partially enclose the sample and to restrict movement of the sample in a direction intersecting the axial direction. The confining structure comprises at least one region facing away from the axial direction and allowing exciting radiation impinging on, and fluorescent radiation emanating from, the sample during measurement to pass therethrough. An apparatus adapted for receiving such a sample holder is also disclosed, comprising a ray source, an X-ray transmission detector, a fluorescence detector and rotating means for rotating at least one of the sample holder, the X-ray source, the X-ray transmission detector and the fluorescence detector. Further, a system comprising such a sample holder and apparatus is disclosed.
(FR) L'invention concerne un porte-échantillon permettant de maintenir un échantillon comprenant un échantillon de carotte de forage ou des déblais de forage pendant des mesures de transmission de rayons X et des mesures de fluorescence. Le porte-échantillon comprend une structure de confinement présentant une direction axiale et qui est conçu, pendant la mesure, pour renfermer au moins partiellement l'échantillon et pour limiter le mouvement de l'échantillon dans une direction croisant la direction axiale. La structure de confinement comprend au moins une zone orientée à l'opposé de la direction axiale et permettant à un rayonnement d'excitation incident sur l'échantillon et à un rayonnement fluorescent émanant de l'échantillon pendant la mesure de passer à travers ce dernier. L'invention concerne également un appareil conçu pour recevoir ledit porte-échantillon, comprenant une source de rayons, un détecteur de transmission de rayons X, un détecteur de fluorescence et un moyen de rotation permettant de faire tourner le porte-échantillon, la source de rayons X, le détecteur de transmission de rayons X et/ou le détecteur de fluorescence. L'invention concerne en outre un système comprenant ledit porte-échantillon et ledit appareil.
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