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1. WO2018140982 - FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY

Publication Number WO/2018/140982
Publication Date 02.08.2018
International Application No. PCT/US2018/016050
International Filing Date 30.01.2018
IPC
G01Q 60/24 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
G01Q 20/00 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
20Monitoring the movement or position of the probe
G01Q 60/00 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
G01Q 60/32 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
32AC mode
CPC
G01Q 30/02
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
02Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
G01Q 30/18
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
18Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields
G01Q 60/32
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
32AC mode
G01Q 60/34
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
32AC mode
34Tapping mode
G01Q 60/38
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
Applicants
  • MOLECULAR VISTA, INC. [US]/[US]
Inventors
  • ALBRECHT, Thomas, R.
Agents
  • HAM, Thomas, H.
Priority Data
62/452,30730.01.2017US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY
(FR) DÉTECTION DE MODULATION DE FRÉQUENCE POUR MICROSCOPIE À FORCE PHOTO-INDUITE
Abstract
(EN)
An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip- sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.
(FR)
L'invention concerne un microscope à force atomique et un procédé de détection de force photo-induite mettant en oeuvre le microscope à force atomique qui utilise la lumière provenant d'une source photonique au niveau d'une interface pointe-échantillon, ce qui entraîne un gradient de force photo-induit qui est détecté par mesure d'une fréquence de résonance d'un mode vibratoire d'un cantilever du microscope à force atomique.
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