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1. (WO2018140982) FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY
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Pub. No.: WO/2018/140982 International Application No.: PCT/US2018/016050
Publication Date: 02.08.2018 International Filing Date: 30.01.2018
IPC:
G01Q 60/24 (2010.01) ,G01Q 20/00 (2010.01) ,G01Q 60/00 (2010.01) ,G01Q 60/32 (2010.01)
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
24
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
20
Monitoring the movement or position of the probe
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
24
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
32
AC mode
Applicants:
MOLECULAR VISTA, INC. [US/US]; 6840 Via Del Oro Suite 110 San Jose, CA 95119, US
Inventors:
ALBRECHT, Thomas, R.; US
Agent:
HAM, Thomas, H.; US
Priority Data:
62/452,30730.01.2017US
Title (EN) FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY
(FR) DÉTECTION DE MODULATION DE FRÉQUENCE POUR MICROSCOPIE À FORCE PHOTO-INDUITE
Abstract:
(EN) An atomic force microscope and method for detecting photo-induced force using the atomic force microscope utilizes light from a photonic source at a tip- sample interface that results in photo-induced force gradient, which is detected by measuring a resonant frequency of a vibrational mode of a cantilever of the atomic force microscope.
(FR) L'invention concerne un microscope à force atomique et un procédé de détection de force photo-induite mettant en oeuvre le microscope à force atomique qui utilise la lumière provenant d'une source photonique au niveau d'une interface pointe-échantillon, ce qui entraîne un gradient de force photo-induit qui est détecté par mesure d'une fréquence de résonance d'un mode vibratoire d'un cantilever du microscope à force atomique.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)