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1. (WO2018140926) FEEDBACK CORRECTION IN SUB-RESONANT TAPPING MODE OF AN ATOMIC FORCE MICROSCOPE

Pub. No.:    WO/2018/140926    International Application No.:    PCT/US2018/015897
Publication Date: Fri Aug 03 01:59:59 CEST 2018 International Filing Date: Wed Jan 31 00:59:59 CET 2018
IPC: G01Q 40/00
Applicants: TUFTS UNIVERSITY
Inventors: ECHOLS-JONES, Piers
MESSNER, William, C.
SOKOLOV, Igor
Title: FEEDBACK CORRECTION IN SUB-RESONANT TAPPING MODE OF AN ATOMIC FORCE MICROSCOPE
Abstract:
A method of carrying out sub-resonant tapping in an atomic force microscope includes causing a probe that is disposed above a sample to be translated in a direction parallel to a horizontal plane defined by the sample and to oscillate in a vertical direction that is perpendicular to the horizontal plane about an equilibrium line that is separated from the horizontal plane by a vertical offset. As a result, the probe repeatedly taps a surface of the sample. Each tap begins with a first contact of the probe on the surface followed by a progressive increase in force exerted by the sample on the probe until a peak force is attained. The vertical offset is controlled by relying at least in part on a feature other than the peak force as a basis for controlling the vertical offset.