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1. (WO2018140133) EMBEDDED MEMORY TESTING WITH STORAGE BORROWING

Pub. No.:    WO/2018/140133    International Application No.:    PCT/US2017/064381
Publication Date: Fri Aug 03 01:59:59 CEST 2018 International Filing Date: Mon Dec 04 00:59:59 CET 2017
IPC: G11C 29/02
G11C 29/04
G11C 29/12
G11C 29/38
G11C 29/44
G11C 29/32
Applicants: QUALCOMM INCORPORATED
Inventors: CHAKRABORTY, Tapan
AVERBUJ, Roberto
Title: EMBEDDED MEMORY TESTING WITH STORAGE BORROWING
Abstract:
An integrated circuit (IC) is disclosed herein for embedded memory testing with storage borrowing. In an example aspect, an integrated circuit includes a functional logic block, a memory block, and test logic. The functional logic block includes multiple storage units and is configured to store functional data in the multiple storage units during a regular operational mode. The test logic is configured to perform a test on the memory block during a testing mode. The test logic is also configured to retain memory test result data in the multiple storage units of the functional logic block during the testing mode.