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1. (WO2018139345) DEVICE FOR DETECTING NUMBER OF FINE PARTICLES
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Pub. No.: WO/2018/139345 International Application No.: PCT/JP2018/001499
Publication Date: 02.08.2018 International Filing Date: 19.01.2018
IPC:
G01N 15/06 (2006.01) ,G01N 27/60 (2006.01) ,H01T 23/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
06
Investigating concentration of particle suspensions
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
60
by investigating electrostatic variables
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
T
SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
23
Apparatus for generating ions to be introduced into non-enclosed gases, e.g. into the atmosphere
Applicants:
日本碍子株式会社 NGK INSULATORS, LTD. [JP/JP]; 愛知県名古屋市瑞穂区須田町2番56号 2-56, Suda-cho, Mizuho-ku, Nagoya-city, Aichi 4678530, JP
Inventors:
水野 和幸 MIZUNO, Kazuyuki; JP
奥村 英正 OKUMURA, Hidemasa; JP
菅野 京一 KANNO, Keiichi; JP
Agent:
特許業務法人アイテック国際特許事務所 ITEC INTERNATIONAL PATENT FIRM; 愛知県名古屋市中区錦二丁目16番26号SC伏見ビル SC Fushimi Bldg., 16-26, Nishiki 2-chome, Naka-ku, Nagoya-shi, Aichi 4600003, JP
Priority Data:
2017-01202426.01.2017JP
Title (EN) DEVICE FOR DETECTING NUMBER OF FINE PARTICLES
(FR) DISPOSITIF DE DÉTECTION DU NOMBRE DE PARTICULES FINES
(JA) 微粒子数検出器
Abstract:
(EN) This device 10 for detecting the number of fine particles has, provided in a vent pipe 12, an electrical charge generating element 20, a collecting device 40, a surplus electrical charge removing device 50, and a number measurement device 60. The electrical charge generating element 20 is provided with a needle-like electrode 22 and a counter electrode 24, and adds electrical charges 18 to fine particles 16 in a gas introduced into the vent pipe 12, to obtain charged fine particles P. Furthermore, the counter electrode 24 of the electrical charge generating element 20 is used as a heater by passing a current therethrough.
(FR) L'invention concerne un dispositif (10) de détection du nombre de particules fines possédant, agencé dans un tuyau d'évent (12), un élément de génération de charge électrique (20), un dispositif de collecte (40), un dispositif d'élimination de charge électrique excédentaire (50) et un dispositif de mesure de nombre (60). L'élément de génération de charge électrique (20) comprend une électrode de type aiguille (22) et une contre-électrode (24) et ajoute des charges électriques (18) à des particules fines (16) dans un gaz introduit dans le tuyau d'évent (12), afin d'obtenir des particules fines chargées P. En outre, la contre-électrode (24) de l'élément de génération de charge électrique (20) est utilisée en tant que dispositif de chauffage en faisant passer un courant à travers ce dernier.
(JA) 微粒子数検出器10は、通気管12内に、電荷発生素子20、捕集装置40、余剰電荷除去装置50及び個数測定装置60を備えている。電荷発生素子20は、針状電極22と対向電極24とを有し、通気管12内に導入されたガス中の微粒子16に電荷18を付加して帯電微粒子Pにする。また、電荷発生素子20の対向電極24は、電流を流すことによりヒータとして利用される。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)