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1. (WO2018139282) SEMICONDUCTOR DEVICE AND ELECTRONIC INSTRUMENT
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Pub. No.: WO/2018/139282 International Application No.: PCT/JP2018/001091
Publication Date: 02.08.2018 International Filing Date: 17.01.2018
IPC:
H01L 27/146 (2006.01) ,G02B 7/02 (2006.01) ,G03B 17/02 (2006.01) ,H04N 5/369 (2011.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14
including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144
Devices controlled by radiation
146
Imager structures
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
7
Mountings, adjusting means, or light-tight connections, for optical elements
02
for lenses
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
B
APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
17
Details of cameras or camera bodies; Accessories therefor
02
Bodies
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
5
Details of television systems
30
Transforming light or analogous information into electric information
335
using solid-state image sensors [SSIS]
369
SSIS architecture; Circuitry associated therewith
Applicants:
ソニーセミコンダクタソリューションズ株式会社 SONY SEMICONDUCTOR SOLUTIONS CORPORATION [JP/JP]; 神奈川県厚木市旭町四丁目14番1号 4-14-1, Asahi-cho, Atsugi-shi, Kanagawa 2430014, JP
Inventors:
宝玉 晋 HOGYOKU Susumu; JP
Agent:
西川 孝 NISHIKAWA Takashi; JP
稲本 義雄 INAMOTO Yoshio; JP
Priority Data:
2017-01430330.01.2017JP
Title (EN) SEMICONDUCTOR DEVICE AND ELECTRONIC INSTRUMENT
(FR) DISPOSITIF À SEMI-CONDUCTEUR ET INSTRUMENT ÉLECTRONIQUE
(JA) 半導体装置、及び、電子機器
Abstract:
(EN) The present art pertains to a semiconductor device with which it is possible to provide an optical system that is stable with respect to heat, and an electronic instrument. Provided is a semiconductor device equipped with a sensor and a holding substrate for holding the sensor, the semiconductor device satisfying the relationships (EI × tI) + (ES × tS) > 30 and 1.5 < CTEI < 4.5, where, regarding the sensor, ES(GPa) represents the Young's modulus and tS(mm) represents the thickness, and regarding the holding substrate, CTEI(ppm/K) represents the linear coefficient, EI(GPa) represents the Young's modulus, and tI(mm) represents the thickness. The present art can be applied to, e.g., a semiconductor package housing an image sensor.
(FR) La présente invention concerne un dispositif à semi-conducteur avec lequel il est possible de fournir un système optique qui est stable vis-à-vis de la chaleur, et un instrument électronique. L'invention concerne un dispositif à semi-conducteur équipé d'un capteur et d'un substrat de maintien destiné à maintenir le capteur, le dispositif à semi-conducteur satisfaisant les relations (EI × tI) + (ES × tS) > 30 et 1,5 < CTEI < 4,5, où, en ce qui concerne le capteur, ES (GPa) représente le module d'élasticité de Young et tS (mm) représente l'épaisseur, et en ce qui concerne le substrat de maintien, CTEI (ppm/K) représente le coefficient linéaire, EI (GPa) représente le module d'élasticité de Young, et tI (mm) représente l'épaisseur. La présente invention peut être appliquée, par exemple, à un boîtier de semi-conducteur logeant un capteur d'image.
(JA) 本技術は、熱に対して安定な光学系を提供することができるようにする半導体装置、及び、電子機器に関する。 センサと、当該センサを保持する保持基板とを備え、センサについて、ヤング率をES(GPa),厚みをtS(mm)とし、保持基板について、線膨張係数をCTEI(ppm/K),ヤング率をEI(GPa),厚みをtI(mm)としたとき、(EI × tI)+(ES × tS) > 30、かつ、1.5 < CTEI < 4.5を満たしている半導体装置が提供される。本技術は、例えば、イメージセンサを収納した半導体パッケージに適用することができる。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)