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1. (WO2018138249) DEVICES, METHODS, AND SAMPLE HOLDER FOR TESTING PHOTONIC INTEGRATED CIRCUITS, AND PHOTONIC INTEGRATED CIRCUITS
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Pub. No.: WO/2018/138249 International Application No.: PCT/EP2018/051939
Publication Date: 02.08.2018 International Filing Date: 26.01.2018
IPC:
G01R 31/317 (2006.01) ,G02F 1/225 (2006.01) ,G02B 6/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
G PHYSICS
02
OPTICS
F
DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1
Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01
for the control of the intensity, phase, polarisation or colour
21
by interference
225
in an optical waveguide structure
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
6
Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
Applicants:
CARL ZEISS AG [DE/DE]; Carl-Zeiss-Straße 22 73447 Oberkochen, DE
Inventors:
HÜBNER, Philipp; DE
RICHTER, Stefan; DE
Agent:
STICHT, Andreas; DE
Priority Data:
10 2017 101 626.027.01.2017DE
Title (EN) DEVICES, METHODS, AND SAMPLE HOLDER FOR TESTING PHOTONIC INTEGRATED CIRCUITS, AND PHOTONIC INTEGRATED CIRCUITS
(FR) DISPOSITIFS, PROCÉDÉS ET PORTE-ÉCHANTILLON POUR L’ESSAI DE CIRCUITS INTÉGRÉS PHOTONIQUES ET CIRCUITS INTÉGRÉS PHOTONIQUES
(DE) VORRICHTUNGEN, VERFAHREN UND PROBENHALTER ZUM TESTEN VON PHOTONISCHEN INTEGRIERTEN SCHALTUNGEN SOWIE PHOTONISCHE INTEGRIERTE SCHALTUNGEN
Abstract:
(EN) The invention relates to methods and to devices for testing a photonic integrated circuit (12) and to a corresponding sample holder and to a photonic integrated circuit. By means of a scanner (11) a location for an illuminating light beam (15) can be selected, such that a targeted coupling of the illuminating light into the photonic integrated circuit (12) is made possible.
(FR) L’invention concerne des procédés et des dispositifs pour l’essai d'un circuit intégré photonique (12), ainsi qu’un porte-échantillon et un circuit intégré photonique associés. Un emplacement pour un faisceau d’éclairage (15) peut être sélectionné au moyen d’un dispositif de balayage (11), ce qui permet une injection ciblée de la lumière d’éclairage dans le circuit intégré photonique (12).
(DE) Es werden Verfahren und Vorrichtungen zum Testen einer photonischen integrierten Schaltung (12) sowie ein entsprechender Probenhalter und eine photonische integrierte Schaltung bereitgestellt. Mittels einer Scaneinrichtung (11) kann dabei ein Ort für einen Beleuchtungslichtstrahl (15) gewählt werden, so dass eine gezielte Einkopplung des Beleuchtungslichts in die photonische integrierte Schaltung (12) ermöglicht wird.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: German (DE)
Filing Language: German (DE)