Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018137562) METHODS AND APPARATUS FOR ON-CHIP DERIVATIVE SPECTROSCOPY
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/137562 International Application No.: PCT/CN2018/073381
Publication Date: 02.08.2018 International Filing Date: 19.01.2018
IPC:
G01N 21/31 (2006.01) ,G01J 3/44 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31
Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28
Investigating the spectrum
44
Raman spectrometry; Scattering spectrometry
Applicants:
HONG KONG APPLIED SCIENCE AND TECHNOLOGY RESEARCH INSTITUTE COMPANY LIMITED [CN/CN]; 5/F, Photonics Centre, 2 Science Park West Avenue, Hong Kong Science Park, Shatin, New Territories Hong Kong, CN
Inventors:
WANG, Jiaqi; CN
ZHANG, Chun; CN
TSANG, Wei Mong; CN
Agent:
CHINA PAT INTELLECTUAL PROPERTY OFFICE; 2nd Floor, Zhongguancun Intellectual Property Building, Block B, No.21 Haidian South Road, Haidian District Beijing 100080, CN
Priority Data:
62/450,88926.01.2017US
Title (EN) METHODS AND APPARATUS FOR ON-CHIP DERIVATIVE SPECTROSCOPY
(FR) PROCÉDÉS ET APPAREIL DE SPECTROSCOPIE DE DÉRIVATION SUR PUCE
Abstract:
(EN) Derivative spectroscopy system (300) for achieving a tunable resolution of 2nm or less in resolving spectral components (328) of an input optical signal (380) is provided so as to estimate derivative spectra of the input optical signal (380) based on the resolved spectral components (328). In the derivative spectroscopy system (300), a first dispersive-element structure (310) spectrally decomposes the input optical signal (380) into subband signals (318). A second dispersive-element structure (320) receives part or all of the subband signals (318) and spectrally decomposes the received subband signals (318) to plural spectral components (328). A material having a temperature-variant refractive index is used to build the second dispersive-element structure (320), enabling a shift of center wavelength of each spectral component (328) as small as 2nm of less upon changing a temperature of the second dispersive-element structure (320). By obtaining three spectral-component sets obtained at three different predetermined temperatures with the center-wavelength shift of 2nm or less, first-and second-order derivative spectra are obtained with good accuracy.
(FR) L’invention concerne un système de spectroscopie de dérivation (300) pour atteindre une résolution réglable inférieure ou égale à 2 nm dans la résolution de composantes spectrales (328) d’un signal optique d’entrée (380) afin d’estimer des spectres de dérivation du signal optique d’entrée (380) sur la base des composantes spectrales (328) résolues. Dans le système de spectroscopie à dérivation (300), une première structure d’éléments dispersifs (310) décompose spectralement le signal optique d’entrée (380) en signaux de sous-bande (318). Une deuxième structure d’éléments dispersifs (320) reçoit tout ou partie des signaux de sous-bande (318) et décompose spectralement les signaux de sous-bande (318) reçus en plusieurs composantes spectrales (328). Un matériau ayant un indice de réfraction variant avec la température est utilisé pour construire la deuxième structure d’éléments dispersifs (320), permettant un décalage de la longueur d’onde centrale de chaque composante spectrale (328) inférieure ou égale à 2 nm lors du changement d’une température de la deuxième structure d’éléments dispersifs (320). En obtenant trois ensembles de composantes spectrales à trois températures préétablies différentes avec le décalage de longueur d’onde centrale inférieur ou égal à 2 nm, des spectres de dérivation de premier et deuxième ordre sont obtenus avec une bonne précision.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)