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1. WO2018132064 - APPARATUS FOR TESTING AN OPTOELECTRONIC DEVICE AND METHOD OF OPERATING THE SAME

Publication Number WO/2018/132064
Publication Date 19.07.2018
International Application No. PCT/SG2018/050010
International Filing Date 09.01.2018
IPC
G01R 1/04 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
04Housings; Supporting members; Arrangements of terminals
G01R 31/26 2014.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 1/0458
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0433Sockets for IC's or transistors
0441Details
0458related to environmental aspects, e.g. temperature
G01R 1/0466
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0433Sockets for IC's or transistors
0441Details
0466concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
G01R 31/2856
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
2856Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
G01R 31/2863
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
286External aspects, e.g. related to chambers, contacting devices or handlers
2863Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
G01R 31/2875
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
2872related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
2874related to temperature
2875related to heating
Applicants
  • HEPTAGON MICRO OPTICS PTE. LTD. [SG]/[SG]
Inventors
  • GEIGER, Jens
  • SHENG, Yeoh Ging
  • HAUSER, Kevin
Agents
  • ALLEN & GLEDHILL LLP
Priority Data
62/445,84213.01.2017US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) APPARATUS FOR TESTING AN OPTOELECTRONIC DEVICE AND METHOD OF OPERATING THE SAME
(FR) APPAREIL POUR TESTER UN DISPOSITIF OPTOÉLECTRONIQUE ET PROCÉDÉ POUR LE FAIRE FONCTIONNER
Abstract
(EN)
Testing apparatus operable to collect optical performance data of optoelectronic devices at different temperatures includes thermal-adjustment devices in thermal and mechanical contact with the optoelectronic devices via optoelectronic device stages. The thermal-adjustment devices can direct thermal energy to the optoelectronic devices under test without heating test targets in close proximity. Consequently, in some instances, spurious results can be avoided and rapid measurement of the optoelectronic devices different temperatures can be achieved.
(FR)
L'invention concerne un appareil de test utilisable pour collecter des données de performance optique de dispositifs optoélectroniques à différentes températures, qui comprend des dispositifs de réglage thermique en contact thermique et mécanique avec les dispositifs optoélectroniques par l'intermédiaire d'étages du dispositif optoélectronique. Les dispositifs de réglage thermique peuvent diriger une énergie thermique vers les dispositifs optoélectroniques à tester sans chauffer les cibles de test à proximité immédiate. Par conséquent, dans certains cas, des faux résultats peuvent être évités et une mesure rapide des dispositifs optoélectroniques à différentes températures peut être obtenue.
Also published as
EP2018739026
Latest bibliographic data on file with the International Bureau