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1. (WO2018128395) METHOD AND DEVICE FOR CHECKING LOW-VOLTAGE DEFECT IN SECONDARY BATTERY

Pub. No.:    WO/2018/128395    International Application No.:    PCT/KR2018/000135
Publication Date: Fri Jul 13 01:59:59 CEST 2018 International Filing Date: Thu Jan 04 00:59:59 CET 2018
IPC: G01R 31/36
H01M 10/48
H01M 10/44
H01M 10/04
Applicants: LG CHEM, LTD.
주식회사 엘지화학
Inventors: KIM, Sung-Tae
김성태
BAE, Joon-Sung
배준성
SUNG, Nak-Gi
성낙기
Title: METHOD AND DEVICE FOR CHECKING LOW-VOLTAGE DEFECT IN SECONDARY BATTERY
Abstract:
The present invention provides a technology for effectively detecting a low-voltage defect which may be generated in a secondary battery. A method for checking a low-voltage defect in a secondary battery, according to the present invention, may comprise: an assembling step of assembling a secondary battery by loading, into a battery case, an electrode assembly in which a cathode plate and an anode plate are laminated with a separator interposed therebetween, and an electrolyte; a first aging step of aging the assembled secondary battery at a temperature of 20°C to 40°C; a first formation step of charging the aged secondary battery with a C-rate of 0.1C to 0.5C; a high-rate charging step of charging the secondary battery with a C-rate of 2C or more after the first formation step; and a detecting step of detecting a defect in the secondary battery after the high-rate charging step.