Search International and National Patent Collections
|1. (WO2018128146) SPECTRAL MEASUREMENT METHOD AND SPECTRAL MEASUREMENT DEVICE|
|Applicants:||TORAY ENGINEERING CO., LTD.
KYOTO PREFECTURAL PUBLIC UNIVERSITY CORPRATION
UKON CRAFT SCIENCE
|Title:||SPECTRAL MEASUREMENT METHOD AND SPECTRAL MEASUREMENT DEVICE|
Provided are a spectral measurement method and a spectral measurement device which make it possible to precisely and accurately identify the structure constituting a predetermined area in a short amount of time. The spectral measurement method includes: an irradiation step for irradiating a sample S with illumination light L3 for imaging, and then irradiating a plurality of locations with laser light L1, which is illumination light for spectrography; an image acquisition step for acquiring an image V made of the form of the sample S and a plurality of irradiation points of the laser light L1; a spectral measurement step for spectrally measuring light excited by the laser light L1; an image processing step for extracting, from image information in the image V of the sample S, first image areas Ar1 etc., which are image areas formed by an identical structure, and then dividing the extracted image areas as closed areas; and an area determination step for superimposing spectral measurement results onto the irradiation points of the laser light L1 in the image of the sample S which has been divided into the image areas, and then identifying the structure of each image area on the basis of the spectral measurement results of the plurality of irradiation points of the laser light L1 in each image area.