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1. (WO2018128059) METHOD FOR INSPECTING GLASS PLATE, METHOD FOR MANUFACTURING SAME, AND DEVICE FOR INSPECTING GLASS PLATE
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2018/128059 International Application No.: PCT/JP2017/044689
Publication Date: 12.07.2018 International Filing Date: 13.12.2017
IPC:
G01N 21/896 (2006.01) ,G01B 11/24 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
89
in moving material, e.g. paper, textiles
892
characterised by the flaw, defect or object feature examined
896
Optical defects in or on transparent materials, e.g. distortion, surface flaws
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
Applicants:
日本電気硝子株式会社 NIPPON ELECTRIC GLASS CO., LTD. [JP/JP]; 滋賀県大津市晴嵐2丁目7番1号 7-1, Seiran 2-chome, Otsu-shi, Shiga 5208639, JP
Inventors:
久良木 正福 KYURAGI Masafuku; JP
山本 浩一 YAMAMOTO Koichi; JP
山本 正善 YAMAMOTO Masayoshi; JP
南 友和 MINAMI Tomokazu; JP
吉野 敬一 YOSHINO Keiichi; JP
藤居 孝英 FUJII Takahide; JP
Agent:
城村 邦彦 SHIROMURA Kunihiko; JP
熊野 剛 KUMANO Tsuyoshi; JP
友廣 真一 TOMOHIRO Shin-ichi; JP
Priority Data:
2017-00118606.01.2017JP
Title (EN) METHOD FOR INSPECTING GLASS PLATE, METHOD FOR MANUFACTURING SAME, AND DEVICE FOR INSPECTING GLASS PLATE
(FR) PROCÉDÉ D'INSPECTION D'UNE PLAQUE DE VERRE, SON PROCÉDÉ DE FABRICATION, ET DISPOSITIF D'INSPECTION DE PLAQUE DE VERRE
(JA) ガラス板の検査方法及びその製造方法並びにガラス板の検査装置
Abstract:
(EN) The present invention has disposed therein: a first imaging system 2 having a first light source 5, a first imaging unit 6 that captures a first transmitted light L1 that is emitted from the first light source 5 and passes through a glass plate G, and a shielding plate 7 that shields a portion of the first transmitted light L1 to form a bright portion and a dark portion in the field of view of the first imaging unit 6; and a second imaging system 3 that has a second light source 8 and a third light source 9, and a second imaging unit 10 that, while capturing, in a bright field, a second transmission light L2 that is emitted from the second light source 8 and passes through the glass plate G, captures, in a dark field, a third transmission light L3 that is emitted from the third light source 9 and passes through the glass plate G. The present invention sorts the types of defects of the glass plate G on the basis of images obtained by the first imaging system 2 and images obtained by the second imaging system 3.
(FR) La présente invention comprend : un premier système d'imagerie (2) comportant une première source de lumière (5), d'une première unité d'imagerie (6) qui capture une première lumière transmise (L1) émise à partir de la première source de lumière (5) et traversant une plaque de verre (G), et une plaque de protection (7) protégeant une partie de la première lumière transmise (L1) pour former une partie lumineuse et une partie sombre dans le champ de vision de la première unité d'imagerie (6) ; et un second système d'imagerie (3) comportant une deuxième source de lumière (8) et une troisième source de lumière (9), et une seconde unité d'imagerie (10) qui, tout en capturant, dans un champ lumineux, une seconde lumière de transmission (L2) qui est émise à partir de la deuxième source de lumière (8) et traverse la plaque de verre (G), capture, dans un champ sombre, une troisième lumière de transmission (L3) qui est émise à partir de la troisième source de lumière (9) et traverse la plaque de verre (G). La présente invention trie les types de défauts de la plaque de verre (G) en fonction des images obtenues par le premier système d'imagerie (2) et des images obtenues par le second système d'imagerie (3).
(JA) 第一光源5と、第一光源5から照射されてガラス板Gを透過した第一透過光L1を撮像する第一撮像部6と、第一透過光L1の一部を遮蔽して第一撮像部6の視野内に明部と暗部を形成する遮蔽板7とを有する第一撮像系2と、第二光源8及び第三光源9と、第二光源8から照射されてガラス板Gを透過した第二透過光L2を明視野で撮像しながら第三光源9から照射されてガラス板Gを透過した第三透過光L3を暗視野で撮像する第二撮像部10とを有する第二撮像系3とを配置し、第一撮像系2で得られた像と第二撮像系3で得られた像とに基づいてガラス板Gの欠陥の種類を識別する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)