Search International and National Patent Collections

1. (WO2018123188) TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT

Pub. No.:    WO/2018/123188    International Application No.:    PCT/JP2017/036031
Publication Date: Fri Jul 06 01:59:59 CEST 2018 International Filing Date: Wed Oct 04 01:59:59 CEST 2017
IPC: G05F 3/24
G11C 16/30
H01L 21/336
H01L 27/115
H01L 29/788
H01L 29/792
Applicants: ASAHI KASEI MICRODEVICES CORPORATION
旭化成エレクトロニクス株式会社
Inventors: SAKAMOTO Toshiro
坂本 敏郎
TSUSHIMA Yuukou
対馬 悠晃
Title: TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT
Abstract:
The purpose of the present invention is to provide a temperature characteristic adjustment circuit capable of making an adjustment to various positive/negative temperature characteristics with extremely small characteristic variation, and suppressing an increase in chip area and current consumption with a simple circuit structure. A temperature characteristic adjustment circuit (1) is provided with: a current source having a nonvolatile memory element (M) which has a control gate region (CG) and a source region (S) and is driven by means of a bias applied between the control gate region (CG) and the source region (S); and an output circuit (6) in which the temperature dependency of an output signal due to the temperature dependency of current amount of a current output from the current source is adjusted by the nonvolatile memory element (M), and which does not have a nonvolatile memory element.