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|1. (WO2018123188) TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT|
|Applicants:||ASAHI KASEI MICRODEVICES CORPORATION
|Title:||TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT|
The purpose of the present invention is to provide a temperature characteristic adjustment circuit capable of making an adjustment to various positive/negative temperature characteristics with extremely small characteristic variation, and suppressing an increase in chip area and current consumption with a simple circuit structure. A temperature characteristic adjustment circuit (1) is provided with: a current source having a nonvolatile memory element (M) which has a control gate region (CG) and a source region (S) and is driven by means of a bias applied between the control gate region (CG) and the source region (S); and an output circuit (6) in which the temperature dependency of an output signal due to the temperature dependency of current amount of a current output from the current source is adjusted by the nonvolatile memory element (M), and which does not have a nonvolatile memory element.