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1. WO2018122814 - METHOD AND OPTICAL MICROSCOPE FOR DETECTING PARTICLES HAVING SUB-DIFFRACTIVE SIZE

Publication Number WO/2018/122814
Publication Date 05.07.2018
International Application No. PCT/IB2017/058544
International Filing Date 30.12.2017
IPC
G02B 21/00 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
G02B 21/36 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
36arranged for photographic purposes or projection purposes
CPC
G01N 15/0205
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
02Investigating particle size or size distribution
0205by optical means, e.g. by light scattering, diffraction, holography or imaging
G01N 2015/0038
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
0038Investigating nanoparticles
G01N 21/21
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
21Polarisation-affecting properties
G01N 21/554
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
55Specular reflectivity
552Attenuated total reflection
553and using surface plasmons
554detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
G02B 21/0092
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
0004specially adapted for specific applications
0092Polarisation microscopes
G02B 21/367
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21Microscopes
36arranged for photographic purposes or projection purposes
365Control or image processing arrangements for digital or video microscopes
367providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
Applicants
  • ISTITUTO NAZIONALE DI FISICA NUCLEARE [IT]/[IT]
Inventors
  • DE LELLIS, Giovanni
  • ALEXANDROV, Andrey
  • TIOUKOV, Valeri
  • D'AMBROSIO, Nicola
Agents
  • SCILLETTA, Andrea
Priority Data
10201600013281330.12.2016IT
Publication Language English (EN)
Filing Language Italian (IT)
Designated States
Title
(EN) METHOD AND OPTICAL MICROSCOPE FOR DETECTING PARTICLES HAVING SUB-DIFFRACTIVE SIZE
(FR) PROCÉDÉ ET MICROSCOPE OPTIQUE PERMETTANT DE DÉTECTER DES PARTICULES AYANT UNE TAILLE SOUS-DIFFRACTIVE
Abstract
(EN)
Optical microscope (100) for detecting particles having sub-diffractive size within a sample, comprising: a display system (50), having a first objective (01); a polarising device (6); an analyser system (60), having a second objective (02) and a reflection element (7), wherein an optical path between the first objective (01) and the second objective (02) is divided into two identical parts symmetric with respect to a coupling plane; a sensor device (S2) configured to detect a plurality of beams corresponding to a plurality of polarisation configurations of the polarising device (6) that is reflected by the reflection element (7), thus acquiring a plurality of images; and one or more processing units configured to perform a two-dimensional method of analysis of the plurality di acquired images.
(FR)
La présente invention concerne un microscope optique (100) permettant de détecter des particules ayant une taille de sous-diffraction à l'intérieur d'un échantillon, ledit microscope optique comprenant : un système d'affichage (50), ayant un premier objectif (01); un dispositif de polarisation (6); un système d'analyse (60), ayant un second objectif (02) et un élément de réflexion (7), un trajet optique entre le premier objectif (01) et le second objectif (02) étant divisé en deux parties identiques symétriques par rapport à un plan de couplage; un dispositif de capteur (S2) configuré de sorte à détecter une pluralité de faisceaux correspondant à une pluralité de configurations de polarisation du dispositif de polarisation (6) qui sont réfléchis par l'élément de réflexion (7), ce qui permet d'acquérir une pluralité d'images; et une ou plusieurs unités de traitement configurées de sorte à effectuer un procédé bidimensionnel d'analyse de la pluralité d'images acquises.
Also published as
Latest bibliographic data on file with the International Bureau