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1. (WO2018106194) NON-DESTRUCTIVE TESTING METHODS AND APPARATUS
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Pub. No.: WO/2018/106194 International Application No.: PCT/SG2017/050610
Publication Date: 14.06.2018 International Filing Date: 11.12.2017
IPC:
G01N 22/00 (2006.01) ,G01R 27/26 (2006.01) ,G01N 23/02 (2006.01) ,G01N 21/88 (2006.01) ,G01N 27/24 (2006.01) ,G01N 27/82 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
22
Investigating or analysing materials by the use of microwaves
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
26
Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
02
by investigating impedance
22
by investigating capacitance
24
Investigating the presence of flaws
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
72
by investigating magnetic variables
82
for investigating the presence of flaws
Applicants:
NANYANG TECHNOLOGICAL UNIVERSITY [SG/SG]; 50 Nanyang Avenue, Singapore 639798, SG
Inventors:
HU, Xiao; SG
MU, Chenzhong; SG
ZHANG, Liying; SG
Agent:
LINDSAY, Jonas Daniel; SG
Priority Data:
10201610348V09.12.2016SG
Title (EN) NON-DESTRUCTIVE TESTING METHODS AND APPARATUS
(FR) PROCÉDÉS ET APPAREIL D’ESSAI NON DESTRUCTIFS
Abstract:
(EN) A non-destructive testing method of analyzing a sample comprising a composite material is disclosed. The method comprises: emitting an electromagnetic signal onto the sample, the electromagnetic signal having a range of frequencies; detecting a response signal transmitted and / or reflected by the sample in response to the electromagnetic signal; processing the response signal to determine variation with frequency of a dielectric permittivity of the sample over the range of frequencies; and determining an indication of a structural characteristic of the sample from a measure of the variation with frequency of the dielectric permittivity of the sample.
(FR) La présente invention concerne un procédé d’essai non destructif d’analyse d’un échantillon comprenant un matériau composite. Le procédé comprend : l’émission d’un signal électromagnétique sur l’échantillon, le signal électromagnétique ayant une plage de fréquences ; la d »é d’un signal de réponse transmis et/ou réfléchi par l’échantillon en réponse au signal électromagnétique ; le traitement du signal de réponse pour déterminer une variation avec la fréquence d’une permittivité diélectrique de l’échantillon dans la plage de fréquences ; et la détermination d’une indication d’une caractéristique structurelle de l’échantillon à partir d’une mesure de la variation avec la fréquence de la permittivité diélectrique de l’échantillon.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)