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1. (WO2018106066) IMAGE-BASED QUANTITATIVE ANALYSIS METHOD OF MATERIALS
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2018/106066    International Application No.:    PCT/KR2017/014407
Publication Date: 14.06.2018 International Filing Date: 08.12.2017
IPC:
G01N 21/65 (2006.01), G02B 21/00 (2006.01), G02B 21/36 (2006.01)
Applicants: RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY [KR/KR]; 2066, Seobu-ro, Jangan-gu Suwon-si Gyeonggi-do 16419 (KR)
Inventors: YUN, Wan Soo; (KR).
KIM, Da Sol; (KR).
KIM, Soo Hyun; (KR)
Agent: NAM, Gun Pil; (KR).
CHA, Sang Yun; (KR).
PARK, Jong Soo; (KR)
Priority Data:
10-2016-0167624 09.12.2016 KR
Title (EN) IMAGE-BASED QUANTITATIVE ANALYSIS METHOD OF MATERIALS
(FR) PROCÉDÉ D’ANALYSE QUANTITATIVE À BASE D’IMAGES DE MATÉRIAUX
(KO) 이미지 기반 물질 정량 분석방법
Abstract: front page image
(EN)A quantitative analysis method of materials is disclosed. The quantitative analysis method of materials comprises the steps of: measuring multiple pieces of quantitative data on a first material from each of N number of samples having different first quantitative values for the first material, the multiple pieces of quantitative data changing depending on the first quantitative values, then calculating a ratio of quantitative data having a value equal to or greater than a pre-configured threshold value among the multiple pieces of quantitative data with respect to each of the N number of samples, and deriving an analysis function accounting for the correlation of the ratio of quantitative data having a value equal to or greater than the threshold value with respect to the quantitative values of the first material using the calculated ratio; and calculating the quantitative values of the first material included in a specimen to be analyzed using the analysis function, whereby a quantitatively analyzable range and quantitative analysis accuracy for a material can be remarkably improved.
(FR)L’invention concerne un procédé d’analyse quantitative de matériaux. Les étapes du procédé d’analyse quantitative de matériaux consistent : à mesurer des éléments multiples de données quantitatives sur un premier matériau à partir chaque échantillon d’un nombre N d’échantillons ayant différentes premières valeurs quantitatives pour le premier matériau, les éléments multiples de données quantitatives changeant en fonction des premières valeurs quantitatives, puis à calculer un ratio des données quantitatives ayant une valeur égale ou supérieure à une valeur de seuil préconfigurée parmi les éléments multiples de données quantitatives, par rapport à chaque échantillon du nombre N d’échantillons, et à déduire une fonction d’analyse prenant en compte la corrélation du ratio de données quantitatives ayant une valeur égale ou supérieure à la valeur de seuil par rapport aux valeurs quantitatives du premier matériau au moyen du ratio calculé ; et à calculer les valeurs quantitatives du premier matériau inclus dans un spécimen à analyser au moyen de la fonction d’analyse, une plage analysable quantitativement et une précision d’analyse quantitative pour un matériau pouvant ainsi être améliorées de manière remarquable.
(KO)물질의 정량 분석방법이 개시된다. 이러한 물질의 정량 분석 방법은 제1 물질에 대한 서로 다른 제1 정량 값을 갖는 N개의 샘플들 각각으로부터 상기 제1 정량 값에 따라 변화하는 상기 제1 물질에 대한 복수의 정량 데이터를 측정한 후 상기 N개의 샘플들 각각에 대해 상기 복수의 정량 데이터 중 기 설정된 임계값 이상인 정량 데이터의 비율을 산출하고, 이를 이용하여 상기 제1 물질의 정량 값에 대한 상기 임계값 이상 정량 데이터의 비율의 관계를 나타내는 분석 함수를 도출하는 단계 및 상기 분석 함수를 이용하여 분석 대상 시료에 대해 이에 포함된 상기 제1 물질의 정량 값을 산출하는 단계를 포함하고, 물질에 대한 정량 분석 가능 범위 및 정확도를 현저하게 향상시킬 수 있다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)