Search International and National Patent Collections

1. (WO2018105607) MEASURING DEVICE, MEASUREMENT ABNORMALITY DETECTING METHOD, AND PROGRAM

Pub. No.:    WO/2018/105607    International Application No.:    PCT/JP2017/043635
Publication Date: Fri Jun 15 01:59:59 CEST 2018 International Filing Date: Wed Dec 06 00:59:59 CET 2017
IPC: G01N 21/64
G01N 21/17
Applicants: KONICA MINOLTA, INC.
コニカミノルタ株式会社
Inventors: AOKI Youichi
青木 洋一
NODA Tetsuya
野田 哲也
Title: MEASURING DEVICE, MEASUREMENT ABNORMALITY DETECTING METHOD, AND PROGRAM
Abstract:
[Problem] To provide a measuring device capable of detecting measurement abnormalities easily, without increasing a hardware load. [Solution] This measuring device is provided with: a radiating means for radiating light onto a region being measured; a light measuring means for measuring light output from the region being measured as a result of the radiation by the radiating means; a driving means for moving the position of at least one of the region being measured and the radiating means; and a determining means for determining abnormalities in the measurement results by comparing measured values of light measured a plurality of times using the light measuring means, while using the driving means to vary the position of the region being measured. The determining means determines that a measurement abnormality has occurred if a reference measured value, which is the measured value that was measured first, is lower than a comparative measured value, which is the highest measured value from among the second and subsequent measured values.