Search International and National Patent Collections

1. (WO2018105541) INSPECTING DEVICE AND INSPECTING METHOD

Pub. No.:    WO/2018/105541    International Application No.:    PCT/JP2017/043416
Publication Date: Fri Jun 15 01:59:59 CEST 2018 International Filing Date: Tue Dec 05 00:59:59 CET 2017
IPC: G01S 7/40
H04B 17/00
Applicants: ALPS ELECTRIC CO., LTD.
アルプス電気株式会社
Inventors: WATANABE, Fumio
渡邊 文夫
Title: INSPECTING DEVICE AND INSPECTING METHOD
Abstract:
[Problem] To provide an inspecting device and an inspecting method with which it is possible to reduce a measuring time for one high-frequency module and to reduce manufacturing costs significantly. [Solution] An inspecting device 100 is provided with: a holding unit 30 capable of holding a high-frequency module 70; an antenna unit 10 which receives and/or transmits a test signal capable of being transmitted or received by the high-frequency module 70; and a parabolic reflector plate 20 which reflects the test signal in a predetermined direction. The holding unit 30 is provided with a holding surface 31 for disposing a plurality of the high-frequency modules 70 side-by-side. The reflector plate 20 is disposed in such a way as to face the holding surface 31, and the antenna unit 10 is disposed at a focal point position 21 of the reflector plate 20.