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1. (WO2018104985) ABNORMALITY ANALYSIS METHOD, PROGRAM, AND SYSTEM

Pub. No.:    WO/2018/104985    International Application No.:    PCT/JP2016/005084
Publication Date: Fri Jun 15 01:59:59 CEST 2018 International Filing Date: Fri Dec 09 00:59:59 CET 2016
IPC: G05B 23/02
Applicants: NEC CORPORATION
日本電気株式会社
Inventors: KAWAI, Takazumi
河合 孝純
Title: ABNORMALITY ANALYSIS METHOD, PROGRAM, AND SYSTEM
Abstract:
The present invention provides an abnormality analysis method, program, and system which display the degrees of abnormality of sensor groups, each sensor group being set as one of a plurality of layers in a hierarchy, and which also facilitate the identification of the cause of the abnormality. An abnormality analysis system 100 according to an embodiment of the present invention is provided with: a group generation unit 120 which generates sensor groups, each being set as one of a plurality of layers in a hierarchy; a group abnormality degree calculation unit 130 which calculates the degree of abnormality of each group from values measured by the sensors in the group; and a display control unit 140 which performs control to display, as a function of time, the degree of abnormality of a group that is set as one of the plurality of layers in the hierarchy.