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|1. (WO2018103693) HYBRID LIGHT MEASUREMENT METHOD FOR MEASURING THREE-DIMENSIONAL PROFILE|
|Applicants:||XI'AN CHISHINE OPTOELECTRONICS TECHNOLOGY CO.LTD.
|Title:||HYBRID LIGHT MEASUREMENT METHOD FOR MEASURING THREE-DIMENSIONAL PROFILE|
A hybrid light measurement method for measuring a three-dimensional profile comprises: Step 1 using an MEMS laser projector to realize projection of a laser light pattern and a grating: and Step 2 performing matching to obtain a parallax, and incorporating a binocular stereo vision to perform reconstruction. The present invention employs MEMS projection technology to realize a hybrid measurement system capable of performing light pattern measurement and grating measurement, thereby realizing quick measurement of three-dimensional profiles of objects having different surface properties. The present invention enables light pattern measurement and grating measurement to be performed by the same measurement system without needing any additional hardware equipment. The projection device used in the present invention enables projection of multiple light patterns, thereby increasing measurement precision and speed.