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1. (WO2018103693) HYBRID LIGHT MEASUREMENT METHOD FOR MEASURING THREE-DIMENSIONAL PROFILE

Pub. No.:    WO/2018/103693    International Application No.:    PCT/CN2017/115007
Publication Date: Fri Jun 15 01:59:59 CEST 2018 International Filing Date: Fri Dec 08 00:59:59 CET 2017
IPC: G01B 11/25
Applicants: XI'AN CHISHINE OPTOELECTRONICS TECHNOLOGY CO.LTD.
西安知象光电科技有限公司
Inventors: ZHOU, Xiang
周翔
LI, Yuqin
李玉勤
LI, Huanhuan
李欢欢
YANG, Tao
杨涛
MA, Li
马力
GUO, Di
郭迪
YAO, Dong
姚东
Title: HYBRID LIGHT MEASUREMENT METHOD FOR MEASURING THREE-DIMENSIONAL PROFILE
Abstract:
A hybrid light measurement method for measuring a three-dimensional profile comprises: Step 1 using an MEMS laser projector to realize projection of a laser light pattern and a grating: and Step 2 performing matching to obtain a parallax, and incorporating a binocular stereo vision to perform reconstruction. The present invention employs MEMS projection technology to realize a hybrid measurement system capable of performing light pattern measurement and grating measurement, thereby realizing quick measurement of three-dimensional profiles of objects having different surface properties. The present invention enables light pattern measurement and grating measurement to be performed by the same measurement system without needing any additional hardware equipment. The projection device used in the present invention enables projection of multiple light patterns, thereby increasing measurement precision and speed.