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1. (WO2018100267) SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN OBJECT
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2018/100267    International Application No.:    PCT/FR2017/053184
Publication Date: 07.06.2018 International Filing Date: 20.11.2017
IPC:
G01N 21/956 (2006.01)
Applicants: VIT [FR/FR]; 8 Rue de Rochepleine 38120 Saint-Egreve (FR)
Inventors: GUILLOT, Nicolas; (FR).
PERRIOLLAT, Mathieu; (FR).
THENAISY, Camille; (FR)
Agent: CABINET BEAUMONT; 4, Place Robert Schuman B.P. 1529 38025 Grenoble Cedex 1 (FR)
Priority Data:
1661652 29.11.2016 FR
Title (EN) SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN OBJECT
(FR) SYSTÈME ET PROCÈDE DE POSITIONNEMENT ET D'INSPECTION OPTIQUE D'UN OBJET
Abstract: front page image
(EN)The invention relates to a method for the optical inspection of an electronic circuit (Card), comprising the acquisition of images of the electronic circuit by image sensors (C). The invention also relates to the use of the images for determining the distance between the position of the electronic circuit (Card) and a position of inspection, and to the use of said images in at least one other step of the method.
(FR)L'invention concerne un procédé d'inspection optique d'un circuit électronique (Card) comprenant l'acquisition d'images du circuit électronique par des capteurs d'images (C), l'utilisation des images pour la détermination de l'écart entre la position du circuit électronique (Card) et une position d'inspection et l'utilisation desdites images à au moins une autre étape du procédé.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: French (FR)
Filing Language: French (FR)