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1. (WO2018099852) METHOD OF ANALYZING A LIGHT DISTRIBUTION OF A VEHICLE HEADLIGHT
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Pub. No.: WO/2018/099852 International Application No.: PCT/EP2017/080501
Publication Date: 07.06.2018 International Filing Date: 27.11.2017
IPC:
G06T 7/00 (2017.01) ,G01M 11/06 (2006.01)
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
T
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
7
Image analysis, e.g. from bit-mapped to non bit-mapped
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
11
Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
02
Testing of optical properties
06
Testing of alignment of vehicle head-light devices
Applicants:
LUMILEDS HOLDING B.V. [NL/NL]; The Base, Tower B5 unit 107 Evert van de Beekstraat 1 1118 CL Schiphol, NL (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, JO, JP, KE, KG, KH, KM, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
LUMILEDS LLC [US/US]; 370 West Trimble Road San Jose, CA California 95131, US (US)
Inventors:
EBERLEIN, Yul, Jens; DE
HEITHOFF, Maximilian; DE
KUEPPER, Lukas; DE
Agent:
RUEBER, Bernhard; DE
Priority Data:
16201740.401.12.2016EP
Title (EN) METHOD OF ANALYZING A LIGHT DISTRIBUTION OF A VEHICLE HEADLIGHT
(FR) PROCÉDÉ D'ANALYSE D'UNE DISTRIBUTION DE LUMIÈRE D'UN PHARE DE VÉHICULE
Abstract:
(EN) The invention describes a method of analyzing a light distribution (20) of a vehicle headlight (10). The method determines a cutoff line (29) based on a brightness distribution within a column (109) of an image of the light distribution (20), the column (109) being perpendicular to a horizon in the image. The method compares the cutoff line (29) with a reference cutoff line and uses the deviations revealed by such comparison to attribute a reduced quality of the light distribution (20) to a particular one of several possible causes. The invention further describes a vehicle headlight analyzer (100) which is arranged to perform the method. The invention finally describes a corresponding computer program product comprising code for executing the method on a processing device (107).
(FR) L'invention concerne un procédé d'analyse d'une distribution de lumière (20) d'un phare de véhicule (10). Le procédé détermine une ligne de coupure (29) sur la base d'une distribution de luminosité à l'intérieur d'une colonne (109) d'une image de la distribution de lumière (20), la colonne (109) étant perpendiculaire à un horizon dans l'image. Le procédé compare la ligne de coupure (29) à une ligne de coupure de référence et utilise les déviations révélées par une telle comparaison pour attribuer une qualité réduite de la distribution de lumière (20) à une cause particulière parmi plusieurs causes possibles. L'invention concerne en outre un analyseur de phare de véhicule (100) qui est conçu pour mettre en œuvre le procédé. L'invention concerne enfin un produit programme d'ordinateur correspondant comprenant un code pour exécuter le procédé sur un dispositif de traitement (107).
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)