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1. (WO2018099643) MEASUREMENT STRUCTURES FOR MEASUREMENTS SUCH AS FREQUENCY AND QUALITY FACTORS OF RESONATORS AND OTHER DEVICES, AND APPARATUS COMPRISING THE SAME
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Pub. No.: WO/2018/099643 International Application No.: PCT/EP2017/076067
Publication Date: 07.06.2018 International Filing Date: 12.10.2017
IPC:
H01P 1/208 (2006.01) ,H01P 11/00 (2006.01) ,H01P 5/103 (2006.01) ,H01P 5/107 (2006.01) ,H01P 7/06 (2006.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
P
WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE
1
Auxiliary devices
20
Frequency-selective devices, e.g. filters
207
Hollow waveguide filters
208
Cascaded cavities; Cascaded resonators inside a hollow waveguide structure
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
P
WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE
11
Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
P
WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE
5
Coupling devices of the waveguide type
08
for linking lines or devices of different kinds
10
for coupling balanced with unbalanced lines or devices
103
Hollow-waveguide/coaxial-line transitions
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
P
WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE
5
Coupling devices of the waveguide type
08
for linking lines or devices of different kinds
10
for coupling balanced with unbalanced lines or devices
107
Hollow-waveguide/strip-line transitions
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
P
WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE
7
Resonators of the waveguide type
06
Cavity resonators
Applicants:
NOKIA SOLUTIONS AND NETWORKS OY [FI/FI]; Karaportti 3 02610 ESPOO, FI
Inventors:
COOPER, Steven; AU
HENDRY, David; AU
BOYLE, Chris; AU
Priority Data:
15/364,55930.11.2016US
Title (EN) MEASUREMENT STRUCTURES FOR MEASUREMENTS SUCH AS FREQUENCY AND QUALITY FACTORS OF RESONATORS AND OTHER DEVICES, AND APPARATUS COMPRISING THE SAME
(FR) STRUCTURES DE MESURE POUR DES MESURES DE TYPE FACTEURS DE FRÉQUENCE ET DE QUALITÉ DE RÉSONATEURS ET AUTRES DISPOSITIFS, ET APPAREIL LES COMPRENANT
Abstract:
(EN) An apparatus includes a measurement structure for performing measurements of an RF device. The measurement structure includes an aperture in a conductive surface of the RF device and a conductive projecting region projecting into the aperture from a conductive perimeter of the aperture and electrically connected to that conductive perimeter. The aperture has a similar width in all dimensions. A combined shape of the aperture and the conductive projecting region does not possess even rotational symmetry about a point where a signal conductor will be placed on the conductive projecting region in order to conduct RF energy between the measurement structure and an external measurement instrument for performing the measurements. The measurement structure may be used for performing measurements of a multimode resonator, the measurements comprising one or more of resonant frequencies and quality factors of resonant modes of the resonator.
(FR) L’invention concerne un appareil qui inclut une structure de mesure destinée à effectuer des mesures d’un dispositif à RF. La structure de mesure inclut un orifice dans une surface conductrice du dispositif à RF et une zone de projection conductrice se projetant dans l’orifice depuis un périmètre conducteur de l’orifice et connectée électriquement à ce périmètre conducteur. L’orifice a une largeur similaire dans toutes les dimensions. Une forme combinée de l’orifice et de la zone de projection conductrice ne possède pas de symétrie en rotation régulière autour d’un point où un conducteur de signal sera placé sur la zone de projection conductrice afin de conduire l’énergie à RF entre la structure de mesure et un instrument de mesure externe destiné à effectuer les mesures. La structure de mesure peut servir à effectuer des mesures d’un résonateur multimodal, les mesures comprenant une ou plusieurs fréquences de résonance et un ou plusieurs facteurs de qualité de modes de résonance du résonateur.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)