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1. (WO2018098551) METHOD AND SYSTEM FOR THE AUTOMATIC INSPECTION OF MATERIAL QUALITY
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Pub. No.: WO/2018/098551 International Application No.: PCT/BR2017/050368
Publication Date: 07.06.2018 International Filing Date: 30.11.2017
IPC:
G06T 7/00 (2017.01) ,G06T 7/13 (2017.01) ,G06T 7/155 (2017.01) ,G06T 7/136 (2017.01) ,G06T 5/30 (2006.01) ,G01N 21/55 (2014.01) ,G01B 11/30 (2006.01) ,G01N 21/88 (2006.01)
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
T
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
7
Image analysis, e.g. from bit-mapped to non bit-mapped
[IPC code unknown for G06T 7/13][IPC code unknown for G06T 7/155][IPC code unknown for G06T 7/136]
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
T
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
5
Image enhancement or restoration, e.g. from bit-mapped to bit-mapped creating a similar image
20
by the use of local operators
30
Erosion or dilatation, e.g. thinning
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
55
Specular reflectivity
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
30
for measuring roughness or irregularity of surfaces
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
Applicants: AUTAZA TECNOLOGIA LTDA - EPP[BR/BR]; Estrada Dr. Altino Bondesan, 500 Bloco Cecompi / Sala 14 12247-016 São José dos Campos, BR
Inventors: DE BONFIM GRIPP, Jorge Augusto; BR
AMARAL DE SOUZA, Enivaldo; BR
PADOVANI, Renan; BR
YUJI SAKURAMOTO, Carlos; BR
Agent: MAGALHÃES PERES GALVÃO DE BOTTON, Leonor; BR
Priority Data:
102016028266-701.12.2016BR
Title (EN) METHOD AND SYSTEM FOR THE AUTOMATIC INSPECTION OF MATERIAL QUALITY
(FR) PROCÉDÉ ET SYSTÈME D’INSPECTION AUTOMATIQUE DE LA QUALITÉ DE MATÉRIAUX
(PT) MÉTODO E SISTEMA PARA A INSPEÇÃO AUTOMÁTICA DE QUALIDADE DE MATERIAIS
Abstract:
(EN) The present document describes methods and systems for the automatic inspection of material quality. A set of lights with a geometric pattern is cast on a material to be analysed. Depending on the material being inspected, same may act as a mirror and the reflected image is captured by a capture device, or the light passes through the material being inspected and the image is captured by a capture device. Defects in the material can be detected by the distortion caused by same in the pattern of the reflected image or passing through. Finally, software is used to identify and locate these distortions, and consequently the defects in the material. This classification of defects is carried out using artificial intelligence techniques.
(FR) La présente invention concerne des procédés et des systèmes d'inspection automatique de la qualité de matériaux. Un ensemble de lumières présentant un motif géométrique est incident sur un matériau à analyser. En fonction du matériau en cours d’inspection, la surface peut se comporter comme un miroir, l'image réfléchie étant capturée par un appareil capteur, ou la lumière peut traverser le matériau inspecté, l'image étant capturée par un appareil capteur. Un défaut dans le matériau est identifié par la distorsion provoquée dans le motif de l'image réfléchie ou ayant traversé le matériau. Enfin, un logiciel identifie et localise ces distorsions et, par conséquent, les défauts du matériau. Cette classification de défauts est réalisée au moyen de techniques d’intelligence artificielle.
(PT) Descreve-se aqui métodos e sistemas para a inspeção automática de qualidade de materiais. Um conjunto de luzes com um padrão geométrico incide sobre um material que se quer analisar. Dependendo do material inspecionado, ela pode se comportar como um espelho e a imagem refletida é capturada por uma aparelho captador ou a luz transpassa o material inspecionado e a imagem é capturada por uma aparelho captador. Um defeito no material é percebido pela distorção que ele provoca no padrão da imagem refletida ou transpassada. Por fim, um software identifica e localiza estas distorções e, consequentemente, os defeitos do material. Esta classificação de defeitos é realizada por técnicas de inteligência artificial.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Portuguese (PT)
Filing Language: Portuguese (PT)