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1. (WO2018088229) CONDUCTIVE DIAMOND PARTICLES, CONDUCTIVE DIAMOND ELECTRODE, AND TESTING DEVICE
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Pub. No.: WO/2018/088229 International Application No.: PCT/JP2017/038760
Publication Date: 17.05.2018 International Filing Date: 26.10.2017
Chapter 2 Demand Filed: 27.08.2018
IPC:
C01B 32/26 (2017.01) ,C23C 16/27 (2006.01) ,C25B 11/12 (2006.01) ,G01N 27/30 (2006.01)
[IPC code unknown for C01B 32/26][IPC code unknown for C23C 16/27][IPC code unknown for C25B 11/12][IPC code unknown for G01N 27/30]
Applicants:
KONDO, Takeshi [JP/JP]; JP (US)
NAKAJIMA, Keito [JP/JP]; JP (US)
AIKAWA, Tatsuo [JP/JP]; JP (US)
YUASA, Makoto [JP/JP]; JP (US)
OSASA, Takahiro [JP/JP]; JP (US)
KOTSUGAI, Akihiro [JP/JP]; JP (US)
RICOH COMPANY, LTD. [JP/JP]; 3-6, Nakamagome 1-chome, Ohta-ku, Tokyo 1438555, JP (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, JO, KE, KG, KH, KM, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
TOKYO UNIVERSITY OF SCIENCE FOUNDATION [JP/JP]; 1-3, Kagurazaka, Shinjuku-ku, Tokyo 1628601, JP (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, JO, KE, KG, KH, KM, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
Inventors:
KONDO, Takeshi; JP
NAKAJIMA, Keito; JP
AIKAWA, Tatsuo; JP
YUASA, Makoto; JP
OSASA, Takahiro; JP
KOTSUGAI, Akihiro; JP
Agent:
HIROTA, Koichi; JP
Priority Data:
2016-22101611.11.2016JP
Title (EN) CONDUCTIVE DIAMOND PARTICLES, CONDUCTIVE DIAMOND ELECTRODE, AND TESTING DEVICE
(FR) PARTICULES DE DIAMANT CONDUCTRICES, ÉLECTRODE DE DIAMANT CONDUCTRICE ET DISPOSITIF DE TEST
Abstract:
(EN) Provided are conductive diamond particles including: particulate bases; and boron-doped diamond films on at least part of surfaces of the particulate bases, wherein an average particle diameter of the conductive diamond particles is greater than 0.5 micrometers, and wherein in Raman spectrum measurement of the conductive diamond particles at an excitation wavelength of 532 micrometers, a ratio of an intensity of the conductive diamond particles at 1,580 cm-1 to an intensity of the conductive diamond particles at 1,332 cm-1 is less than 0.090.
(FR) L'invention concerne des particules de diamant conductrices comprenant : des bases particulaires; et des films de diamant dopé au bore sur au moins une partie des surfaces des bases particulaires. Un diamètre de particule moyen des particules de diamant conductrices est supérieur à 0,5 micromètre, et dans une mesure de spectre Raman des particules de diamant conductrices à une longueur d'onde d'excitation de 532 micromètres, un rapport d'une intensité des particules de diamant conductrices à 1 580 cm-1 à une intensité des particules de diamant conductrices à 1 332 cm-1 est inférieur à 0,090.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)