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1. (WO2018086299) IMAGE PROCESSING-BASED INSULATOR DEFECT DETECTION METHOD AND SYSTEM

Pub. No.:    WO/2018/086299    International Application No.:    PCT/CN2017/078686
Publication Date: Fri May 18 01:59:59 CEST 2018 International Filing Date: Fri Mar 31 01:59:59 CEST 2017
IPC: G06T 7/13
G06T 7/136
Applicants: QINGYUAN POWER SUPPLY BUREAU OF GUANGDONG POWER GRID CO., LTD.
广东电网有限责任公司清远供电局
Inventors: SU, Chao
苏超
HU, Jinlei
胡金磊
WANG, Cong
王丛
YIN, Zuchun
尹祖春
ZHEN, Hongjun
甄鸿俊
OUYANG, Ye
欧阳业
Title: IMAGE PROCESSING-BASED INSULATOR DEFECT DETECTION METHOD AND SYSTEM
Abstract:
The present invention relates to an image processing-based insulator defect detection method and system. An image including an insulator is transformed from an RGB color space into an HIS color space, and segmentation is performed to obtain single-channel images of a tone component and a saturation component. Intersection taking is performed to extract an insulator contour, and then morphological corrosion, dilation operation, regional growth, and connected region labeling are performed on an operator using an oval as a structural element in an insulator contour image. According to areas of all connected regions, a non-insulator image is removed from the image obtained after the regional growth operation to obtain a pseudo standard binary image. The image obtained after closing operation is compared with the pseudo standard binary image and an insulator defect is determined on the basis of the comparison result. The method is easy to achieve, operations are simple, and operation speed is high.