Search International and National Patent Collections

1. (WO2018086186) FOLLOW-UP MULTI-POINT CONTACT-TYPE DEVICE FOR MEASURING CIRCUMFERENTIAL STRAIN

Pub. No.:    WO/2018/086186    International Application No.:    PCT/CN2016/109702
Publication Date: Fri May 18 01:59:59 CEST 2018 International Filing Date: Wed Dec 14 00:59:59 CET 2016
IPC: G01B 21/32
Applicants: HOHAI UNIVERSITY
河海大学
Inventors: ZHU, Qizhi
朱其志
SHI, Hailing
史海岭
Title: FOLLOW-UP MULTI-POINT CONTACT-TYPE DEVICE FOR MEASURING CIRCUMFERENTIAL STRAIN
Abstract:
Disclosed is a follow-up multi-point contact-type device for measuring circumferential strain, comprising a connecting ring (1), fixators (2), LVDT sensors (3), and several uniformly distributed mounting members (104) penetrating a side wall of the connecting ring. The mounting members are square and are provided with circular through holes, and the fixators and the LVDT sensors are alternately mounted in the through holes by means of the mounting members. The fixator comprises a fixing rod having an extension function, and end caps arranged at two ends of the fixing rod, wherein the end caps, which are in contact with a sample mounted in the center of the connecting ring, are arc-shaped end caps (201), the arc shape matches an outer periphery of the sample, a fixator spring (202) is fitted over the fixing rod, and two ends of the fixator spring are respectively fixed to the arc-shaped end caps and the mounting members. A probe (301) of the LVDT sensor faces the sample, a sensor spring (302) is fitted over a fixing rod of the LVDT sensor, and two ends of the sensor spring are respectively fixed to a probe base and the mounting members. The device can measure the circumferential deformation of any interface of a cylindrical rock sample or a cylindrical pipeline, has a large measuring range and a large control range, has a simple structure and good stability, and is not susceptible to external interference.