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1. (WO2018067211) AUTOMATED MODEL-BASED INSPECTION SYSTEM FOR SCREENING ELECTRONIC COMPONENTS

Pub. No.:    WO/2018/067211    International Application No.:    PCT/US2017/037705
Publication Date: Fri Apr 13 01:59:59 CEST 2018 International Filing Date: Fri Jun 16 01:59:59 CEST 2017
IPC: G01N 21/956
Applicants: RAYTHEON COMPANY
Inventors: STONE, Kristen
CINTRON-APONTE, Alexandra
SIMONS, Blair
Title: AUTOMATED MODEL-BASED INSPECTION SYSTEM FOR SCREENING ELECTRONIC COMPONENTS
Abstract:
A method includes obtaining (1304) data associated with an electronic component (202a-202n). The method also includes conducting (1306, 1314, 1318) a multi-tier inspection process to verify a conformance of the electronic component. Each of the tiers includes a different type of identification test, and at least one of the tiers is configured to provide fuzzy outputs. The method further includes analyzing (1308) the data associated with the electronic component using one or more first tests associated with a first of the tiers (1306) to determine whether the electronic component conforms to a pre-specified requirement. In addition, the method includes generating an output based on the analysis and determining whether additional testing is required using one or more next-level tests associated with another of the tiers (1314, 1318).