Search International and National Patent Collections

1. (WO2018066524) DIAGNOSIS ASSISTANCE DEVICE FOR OPTICAL CHARACTERISTIC MEASUREMENT DEVICE, AND DIAGNOSIS ASSISTANCE METHOD FOR OPTICAL CHARACTERISTIC MEASUREMENT DEVICE

Pub. No.:    WO/2018/066524    International Application No.:    PCT/JP2017/035860
Publication Date: Fri Apr 13 01:59:59 CEST 2018 International Filing Date: Tue Oct 03 01:59:59 CEST 2017
IPC: G01J 3/02
G01J 3/50
G06Q 10/00
Applicants: KONICA MINOLTA, INC.
コニカミノルタ株式会社
Inventors: DEISHI, Satoshi
出石 聡史
MATSUMOTO, Takuya
松本 卓也
CHONO, Hironori
蝶野 尋紀
Title: DIAGNOSIS ASSISTANCE DEVICE FOR OPTICAL CHARACTERISTIC MEASUREMENT DEVICE, AND DIAGNOSIS ASSISTANCE METHOD FOR OPTICAL CHARACTERISTIC MEASUREMENT DEVICE
Abstract:
The diagnosis assistance device according to the present invention assists in diagnosing an optical characteristic measurement device for operating on the basis of the content of a setting stored in a setting storage unit of the optical characteristic measurement device, and has a first storage unit, a second storage unit, a processing unit, a first command unit, a diagnosis unit, and a second command unit. The first storage unit stores first setting information in advance for indicating the content of the setting at the time of diagnosis. The processing unit acquires, from the setting storage unit, second setting information for indicating the content of the setting at the time of use, the second setting information being stored in advance in the setting storage unit, and performs processing for causing the second setting information to be stored in the second storage unit. The first command unit issues a command for causing the first setting information stored in the first storage unit to be stored in the setting storage unit. The diagnosis unit acquires a measurement result indicating a value measured by the optical characteristic measurement device, the optical characteristic measurement device operating on the basis of the content of the setting indicated by the first setting information stored in the setting storage unit. The second command unit issues a command for causing the second setting information stored in the second storage unit to be stored in the setting storage unit after the measurement result is acquired.