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Pub. No.:    WO/2018/066140    International Application No.:    PCT/JP2016/080016
Publication Date: 12.04.2018 International Filing Date: 07.10.2016
G06F 17/50 (2006.01), G06F 11/36 (2006.01)
Applicants: HITACHI, LTD. [JP/JP]; 6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo 1008280 (JP)
Inventors: MATSUBARA Masahiro; (JP)
Agent: HIRAKI Yusuke; (JP).
FUJITA Takashi; (JP).
WATANABE Toshiaki; (JP)
Priority Data:
(JA) 設計検証装置
Abstract: front page image
(EN)The purpose of the present invention is to provide a technique that facilitates an automatic inspection as to whether design specifications comply with required specifications even when the required specifications and the design specifications are represented by different notations. A design verification apparatus according to the present invention inspects whether the design specifications comply with the required specifications by using a logical expression in which symbols correspond to each other between the required specifications and the design specifications.
(FR)L'objectif de l’invention est de fournir une technique qui facilite une inspection automatique afin de savoir si les spécifications de conception sont conformes aux spécifications requises même lorsque les spécifications requises et les spécifications de conception sont représentées par des notations différentes. Selon l’invention, un appareil de vérification de conception inspecte si les spécifications de conception sont conformes aux spécifications requises en utilisant une expression logique dans laquelle les symboles correspondent l’un à l’autre entre les spécifications requises et les spécifications de conception.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)