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1. (WO2018064653) CONCURRENT SUBTRACTIVE AND SUBTRACTIVE ASSEMBLY FOR COMPARATIVE METAGENOMICS
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2018/064653    International Application No.:    PCT/US2017/054664
Publication Date: 05.04.2018 International Filing Date: 30.09.2017
IPC:
G06F 19/10 (2011.01), C12Q 1/68 (2018.01)
Applicants: INDIANA UNIVERSITY RESEARCH AND TECHNOLOGY CORPORATION [US/US]; 518 Indiana Avenue Indianapolis, Indiana 46202 (US)
Inventors: YE, Yuzhen; (US)
Agent: BANAKAR, Kapil U.; (US)
Priority Data:
62/402,925 30.09.2016 US
Title (EN) CONCURRENT SUBTRACTIVE AND SUBTRACTIVE ASSEMBLY FOR COMPARATIVE METAGENOMICS
(FR) ASSEMBLAGE SOUSTRACTIF ET ASSEMBLAGE SOUSTRACTIF SIMULTANÉ DESTINÉS À LA MÉTAGÉNOMIQUE COMPARATIVE
Abstract: front page image
(EN)A method for characterizing disease-associated microbial marker genes comprising: counting k-mers of at least two samples; loading k-mers into an array; extracting reads based on differential sequence signatures; and assembling contigs and phylogenetically annotating the contigs.
(FR)Un procédé de caractérisation de gènes marqueurs microbiens associés à une maladie comprend les étapes consistant à : compter les k-mères d'au moins deux échantillons; charger les k-mères dans un réseau; extraire les séquences lues sur la base des signatures de séquences différentielles; et assembler les contigs et les annoter phylogénétiquement.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)