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1. (WO2018063418) COMPACT TESTING SYSTEM
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2018/063418 International Application No.: PCT/US2016/055780
Publication Date: 05.04.2018 International Filing Date: 06.10.2016
IPC:
G01R 31/3177 (2006.01) ,G06F 9/00 (2006.01) ,G06F 11/26 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3177
Testing of logic operation, e.g. by logic analysers
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
9
Arrangements for programme control, e.g. control unit
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
11
Error detection; Error correction; Monitoring
22
Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
26
Functional testing
Applicants:
XCERRA CORPORATION [US/US]; 825 University Avenue Norwood, Massachusetts 02062, US
Inventors:
BROWN, Benjamin; US
POFFENBERGER, Russel; US
Agent:
COLANDREO, Brian J.; US
ABRAMSON, Michael T.; US
PLACKER, Jeffrey T.; US
WHITTENBERGER, Mark H.; US
Priority Data:
15/281,96630.09.2016US
Title (EN) COMPACT TESTING SYSTEM
(FR) SYSTÈME DE TEST COMPACT
Abstract:
(EN) An automated test platform includes a CPU subsystem housed in an enclosure and configured to execute an automated test process. A test head is housed in the enclosure and is configured to apply one or more test signals to a device under test. A power supply is housed in the enclosure and is configured to provide electrical power to the CPU subsystem and the test head.
(FR) L’invention concerne une plate-forme de test automatisée comprenant un sous-système de CPU logé dans une enceinte et conçu pour exécuter un processus de test automatisé. Une tête de test est logée dans l'enceinte et est conçue pour appliquer un ou plusieurs signaux de test à un dispositif soumis au test. Une alimentation électrique est logée dans l'enceinte et est conçue pour fournir de l'énergie électrique au sous-système de CPU et à la tête de test.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)