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1. (WO2018062215) OBSERVATION DEVICE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/062215 International Application No.: PCT/JP2017/034826
Publication Date: 05.04.2018 International Filing Date: 27.09.2017
IPC:
G02B 21/26 (2006.01) ,C12M 1/34 (2006.01) ,G01N 21/01 (2006.01) ,G01N 21/17 (2006.01) ,G02B 21/34 (2006.01)
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
24
Base structure
26
Stages; Adjusting means therefor
C CHEMISTRY; METALLURGY
12
BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
M
APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY
1
Apparatus for enzymology or microbiology
34
Measuring or testing with condition measuring or sensing means, e.g. colony counters
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
34
Microscope slides, e.g. mounting specimens on microscope slides
Applicants: OLYMPUS CORPORATION[JP/JP]; 2951 Ishikawa-machi, Hachioji-shi, Tokyo 1928507, JP
Inventors: MOCHIZUKI, Tsuyoshi; JP
TAKAHASHI, Shintaro; JP
MATSUSHITA, Akira; JP
TANIKAWA, Yohei; JP
MIZUNAKA, Masaru; JP
TAKIMOTO, Shinichi; JP
Agent: UEDA, Kunio; JP
YANAGI, Junichiro; JP
OGURI, Mayumi; JP
TAKEUCHI, Kuniyoshi; JP
Priority Data:
2016-19247830.09.2016JP
Title (EN) OBSERVATION DEVICE
(FR) DISPOSITIF D'OBSERVATION
(JA) 観察装置
Abstract:
(EN) Through the present invention, the inconvenience of adding a mark specifying a desired sample is eliminated and working efficiency is enhanced even when the present invention is used in a limited space such as a clean bench. Provided is an observation device (1) provided with: a lid (3a) capable of transmitting illumination light and to which a container (3) accommodating a sample (X) is mounted; and an imaging unit (11) for capturing an image of transmitted light below the sample (X) and a top plate (5a), the transmitted light being transmitted through the sample (X) from above and transmitted through the lid (3a); a mark (5b) for specifying the viewing range of the imaging unit (11) being provided to the lid (3a).
(FR) Grâce à la présente invention, l'inconvénient de l'ajout d'une marque spécifiant un échantillon souhaité est éliminé et l'efficacité de travail est améliorée même lorsque la présente invention est utilisée dans un espace limité tel qu'un banc propre. L'invention concerne un dispositif d'observation (1) pourvu : d'un couvercle (3a) apte à transmettre une lumière d'éclairage et auquel un récipient (3) recevant un échantillon (X) est monté ; et une unité d'imagerie (11) permettant de capturer une image de lumière transmise au-dessous de l'échantillon (X) et une plaque supérieure (5a), la lumière transmise étant transmise à travers l'échantillon (X) depuis le dessus et transmise à travers le couvercle (3a) ; une marque (5b) permettant de spécifier la plage de visualisation de l'unité d'imagerie (11) étant prévue sur le couvercle (3a).
(JA) クリーンベンチのような限られたスペースで使用する場合にも、所望の試料を特定するマークを付す煩わしさが解消され、作業効率を向上する。試料(X)を収容した容器(3)が載置される照明光を透過可能な蓋(3a)と、照明光が上方から試料(X)を透過しかつ蓋(3a)を透過した透過光を試料(X)および天板(5a)の下方において撮影する撮像部(11)とを備え、蓋(3a)に撮像部(11)の視野範囲を特定するマーク(5b)が設けられている観察装置(1)を提供する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)