Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018061608) WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD USING THE SAME
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/061608 International Application No.: PCT/JP2017/031495
Publication Date: 05.04.2018 International Filing Date: 31.08.2017
IPC:
G01N 23/223 (2006.01) ,G01N 23/207 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
22
by measuring secondary emission
223
by irradiating the sample with X-rays and by measuring X-ray fluorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
20
by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
207
by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
Applicants:
株式会社リガク RIGAKU CORPORATION [JP/JP]; 東京都昭島市松原町3丁目9番12号 9-12, Matsubara-cho 3-chome, Akishima-shi, Tokyo 1968666, JP
Inventors:
加藤 秀一 KATO, Shuichi; JP
片岡 由行 KATAOKA, Yoshiyuki; JP
藤村 一 FUJIMURA, Hajime; JP
山田 隆 YAMADA, Takashi; JP
Agent:
杉本 修司 SUGIMOTO, Shuji; JP
野田 雅士 NODA, Masashi; JP
堤 健郎 TSUTSUMI, Takeo; JP
Priority Data:
2016-19435530.09.2016JP
Title (EN) WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD USING THE SAME
(FR) DISPOSITIF D'ANALYSE DE FLUORESCENCE X À DISPERSION EN LONGUEUR D'ONDE ET PROCÉDÉ D'ANALYSE DE FLUORESCENCE X L'UTILISANT
(JA) 波長分散型蛍光X線分析装置およびそれを用いる蛍光X線分析方法
Abstract:
(EN) This wavelength dispersive X-ray fluorescence spectrometer is provided with: a position-sensitive detector (10) that detects each of the intensities of a secondary X-ray (41) at different spectral angles using a corresponding detection element (7); a measurement spectrum display means (14) that displays, on a display (15), the relation between the position of the detection element (7) in a direction of arrangement and the detection strength of the detection element (7) as a measurement spectrum; a detection area setting means (16) for setting a peak area and a background area; and a quantification means (17) that uses the peak intensity in the peak area, the background intensity in the background area, and a background correction coefficient as a basis to calculate the intensity of X-ray fluorescence to be measured as a net intensity and perform quantitative analysis.
(FR) Ce dispositif d'analyse de fluorescence X à dispersion en longueur d'onde comporte : un détecteur sensible à la position (10) qui détecte chacune des intensités d'un rayon X secondaire (41) sous différents angles spectraux à l'aide d'un élément de détection correspondant (7); un moyen d'affichage de spectre de mesure (14) qui affiche, sur un dispositif d'affichage (15), la relation entre la position de l'élément de détection (7) dans une direction d'agencement et l'intensité de détection de l'élément de détection (7) sous la forme d'un spectre de mesure; un moyen de paramétrage de la zone de détection (16) pour le paramétrage d'une zone de crête et d'une zone de référence; et un moyen de quantification (17) qui utilise l'intensité de crête dans la zone de crête, l'intensité de référence dans la zone de référence, et un coefficient de correction de référence en tant que base pour calculer l'intensité de fluorescence X à mesurer en tant qu'intensité nette et pour effectuer une analyse quantitative.
(JA) 本発明の波長分散型蛍光X線分析装置は、相異なる分光角度の2次X線(41)の各強度を対応する検出素子(7)で検出する位置敏感型検出器(10)と、検出素子(7)の配列方向位置と検出素子(7)の検出強度との関係を測定スペクトルとして表示器(15)に表示する測定スペクトル表示手段(14)と、ピーク領域およびバックグラウンド領域が設定される検出領域設定手段(16)と、ピーク領域におけるピーク強度、バックグラウンド領域におけるバックグラウンド強度およびバックグラウンド補正係数に基づいて、ネット強度として測定対象の蛍光X線の強度を算出して定量分析を行う定量手段(17)とを備える。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)