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1. (WO2018061608) WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD USING THE SAME

Pub. No.:    WO/2018/061608    International Application No.:    PCT/JP2017/031495
Publication Date: Fri Apr 06 01:59:59 CEST 2018 International Filing Date: Fri Sep 01 01:59:59 CEST 2017
IPC: G01N 23/223
G01N 23/207
Applicants: RIGAKU CORPORATION
株式会社リガク
Inventors: KATO, Shuichi
加藤 秀一
KATAOKA, Yoshiyuki
片岡 由行
FUJIMURA, Hajime
藤村 一
YAMADA, Takashi
山田 隆
Title: WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD USING THE SAME
Abstract:
This wavelength dispersive X-ray fluorescence spectrometer is provided with: a position-sensitive detector (10) that detects each of the intensities of a secondary X-ray (41) at different spectral angles using a corresponding detection element (7); a measurement spectrum display means (14) that displays, on a display (15), the relation between the position of the detection element (7) in a direction of arrangement and the detection strength of the detection element (7) as a measurement spectrum; a detection area setting means (16) for setting a peak area and a background area; and a quantification means (17) that uses the peak intensity in the peak area, the background intensity in the background area, and a background correction coefficient as a basis to calculate the intensity of X-ray fluorescence to be measured as a net intensity and perform quantitative analysis.