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1. (WO2018061287) ELECTRICAL DEVICE, AND DIAGNOSTIC APPARATUS FOR ELECTRICAL DEVICE

Pub. No.:    WO/2018/061287    International Application No.:    PCT/JP2017/017712
Publication Date: Fri Apr 06 01:59:59 CEST 2018 International Filing Date: Thu May 11 01:59:59 CEST 2017
IPC: H02M 7/48
G01K 7/00
G01R 31/26
Applicants: HITACHI, LTD.
株式会社日立製作所
Inventors: OGAWA Takashi
小川 貴史
SAKURAI Naoki
櫻井 直樹
Title: ELECTRICAL DEVICE, AND DIAGNOSTIC APPARATUS FOR ELECTRICAL DEVICE
Abstract:
The purpose of the present invention is to make it possible to estimate the temperature of a semiconductor element using a simple structure. To do that, there are provided: one or a plurality of semiconductor elements (104, 106); drive circuits (107, 108) that receive a control signal (Va) that commands an on state or an off state of the semiconductor elements (104, 106), and drive the semiconductor elements (104, 106) on the basis of the control signal (Va); a DC voltage power supply (150) that gives output power to the semiconductor elements (104, 106); a detector (114) that detects a noise component (In) that is superimposed on the output of the DC voltage output supply, and is generated by the semiconductor elements; and a deviation time measuring unit (111) that measures deviation time, which is the difference between the timing when the control signal (Va) has commanded the off state, and the timing when the noise component (In) was generated.