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1. (WO2018060420) MULTIPLE OFFSET INTERFEROMETER
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Pub. No.: WO/2018/060420 International Application No.: PCT/EP2017/074769
Publication Date: 05.04.2018 International Filing Date: 29.09.2017
IPC:
G03H 1/04 (2006.01) ,G03H 1/08 (2006.01) ,G03H 1/26 (2006.01) ,G03H 1/02 (2006.01)
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
H
HOLOGRAPHIC PROCESSES OR APPARATUS
1
Holographic processes or apparatus using light, infra-red, or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
04
Processes or apparatus for producing holograms
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
H
HOLOGRAPHIC PROCESSES OR APPARATUS
1
Holographic processes or apparatus using light, infra-red, or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
04
Processes or apparatus for producing holograms
08
Synthesising holograms
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
H
HOLOGRAPHIC PROCESSES OR APPARATUS
1
Holographic processes or apparatus using light, infra-red, or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
26
Processes or apparatus specially adapted to produce multiple holograms or to obtain images from them, e.g. multicolour technique
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
H
HOLOGRAPHIC PROCESSES OR APPARATUS
1
Holographic processes or apparatus using light, infra-red, or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
02
Details
Applicants:
SIEMENS AKTIENGESELLSCHAFT [DE/DE]; Werner-von-Siemens-Straße 1 80333 München, DE
Inventors:
ENGEL, Thomas; DE
HAYDEN, Oliver; DE
Priority Data:
10 2016 219 018.030.09.2016DE
Title (EN) MULTIPLE OFFSET INTERFEROMETER
(FR) INTERFÉROMÈTRE À DÉCALAGE MULTIPLE
(DE) INTERFEROMETER MIT MEHRFACHEM VERSATZ
Abstract:
(EN) The invention relates to a device, such as a digital holographic microscope (1), for detecting and processing a first full image of a measurement object, measured with a first offset, wherein an arrangement is provided for generating at least one further full image with at least one offset that differs from said first offset.
(FR) L'invention concerne un appareil, par exemple un microscope holographique numérique (1), permettant l’acquisition et le traitement d'une première image totale, mesurée avec un premier décalage, d'un objet mesuré, un dispositif destiné à générer au moins une autre image totale avec au moins un décalage différent du premier étant produit.
(DE) Die Erfindung betrifft eine Vorrichtung, beispielsweise ein Digitales Holographisches Mikroskop (1), zur Erfassung und Bearbeitung eines mit einem ersten Versatz gemessenen ersten Gesamtbildes eines Messobjektes, wobei eine Einrichtung zur Erzeugung mindestens eines weiteren Gesamtbildes mit mindestens einem zum ersten Versatz verschieden Versatz geschaffen ist.
 front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: German (DE)
Filing Language: German (DE)