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1. (WO2018059657) SURGICAL MICROSCOPE COMPRISING AN INFRARED SPECTROMETER AND METHOD FOR DETERMINING PATHOLOGICAL IMPLICATIONS THEREWITH
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2018/059657 International Application No.: PCT/EP2016/072931
Publication Date: 05.04.2018 International Filing Date: 27.09.2016
IPC:
G02B 21/00 (2006.01) ,G01J 3/28 (2006.01) ,G02B 5/20 (2006.01) ,G02B 27/12 (2006.01) ,G02B 21/18 (2006.01) ,G02B 21/16 (2006.01) ,G02B 27/09 (2006.01) ,G02B 27/10 (2006.01) ,G02B 27/14 (2006.01)
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28
Investigating the spectrum
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5
Optical elements other than lenses
20
Filters
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
27
Other optical systems; Other optical apparatus
10
Beam splitting or combining systems
12
operating by refraction only
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
18
Arrangements with more than one light-path, e.g. for comparing two specimens
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
16
adapted for ultra-violet illumination
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
27
Other optical systems; Other optical apparatus
09
Beam shaping, e.g. changing the cross-sectioned area, not otherwise provided for
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
27
Other optical systems; Other optical apparatus
10
Beam splitting or combining systems
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
27
Other optical systems; Other optical apparatus
10
Beam splitting or combining systems
14
operating by reflection only
Applicants:
SIEMENS AKTIENGESELLSCHAFT [DE/DE]; Werner-von-Siemens-Straße 1 80333 München, DE
Inventors:
ENGEL, Thomas; DE
FLEISCHER, Maximilian; DE
GIGLER, Alexander Michael; DE
PASTUSIAK, Remigiusz; DE
PAUST, Tobias; DE
SIMON, Elfriede; DE
STÜTZ, Evamaria; DE
Priority Data:
Title (EN) SURGICAL MICROSCOPE COMPRISING AN INFRARED SPECTROMETER AND METHOD FOR DETERMINING PATHOLOGICAL IMPLICATIONS THEREWITH
(FR) MICROSCOPE CHIRURGICAL DOTÉ D'UN SPECTROMÈTRE À INFRAROUGE ET PROCÉDÉ DE DÉTERMINATION DES INCIDENCES PATHOLOGIQUES FAISANT APPEL À CELUI-CI
(DE) OPERATIONSMIKROSKOP MIT EINEM INFRAROTSPEKTROMETER UND VERFAHREN ZUR FESTSTELLUNG PATHOLOGISCHER IMPLIKATIONEN DAMIT
Abstract:
(EN) The invention relates to an assembly and a method for determining pathological implications in which an infrared, in particular near infrared spectrometer integrated into an operational microscope is operated.
(FR) L'invention concerne un ensemble et un procédé de détermination des incidences pathologiques comprenant la mise en oeuvre d’un spectromètre à infrarouge, en particulier à infrarouge proche, intégré dans un microscope chirurgical.
(DE) Die Erfindung betrifft eine Anordnung und ein Verfahren zur Feststellung pathologischer Implikationen bei denen ein in einem Operationsmikroskop integriertes Infrarot-, insbesondere Nahinfrarot-, Spektrometer betrieben wird.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: German (DE)
Filing Language: German (DE)