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Machine translation
1. (WO2018058466) INTERFERENCE MEASUREMENT
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2018/058466    International Application No.:    PCT/CN2016/100939
Publication Date: 05.04.2018 International Filing Date: 29.09.2016
IPC:
H04W 72/04 (2009.01)
Applicants: NOKIA TECHNOLOGIES OY [FI/FI]; Karaportti 3 F-02610 Espoo (FI).
NOKIA TECHNOLOGIES (BEIJING) CO., LTD. [CN/CN]; Unit 18, Room 1001, Level 10, East Tower, World Financial Center, No. 1, East Third Ring Middle Road, Chaoyang District, Beijing 100020 (CN) (LC only)
Inventors: ENESCU, Mihai; (FI).
MIAO, Deshan; (CN)
Agent: KING & WOOD MALLESONS; 20th Floor, East Tower, World Financial Centre No.1 Dongsanhuan Zhonglu, Chaoyang District Beijing 100020 (CN)
Priority Data:
Title (EN) INTERFERENCE MEASUREMENT
(FR) MESURE D'INTERFÉRENCE
Abstract: front page image
(EN)A flexible way to configure interference measurements is achieved by configuring a terminal device for interference measurement resources with a configuration comprising at least a first part indicating interference resources that may overlap with one or more reference symbols, and a second part configuration indicating a type of the overlap.
(FR)Une manière souple de configurer des mesures d'interférence est obtenue en configurant un dispositif terminal pour des ressources de mesure d'interférence avec une configuration comprenant au moins une première partie indiquant des ressources d'interférence qui peuvent se chevaucher avec un ou plusieurs symboles de référence, et une seconde configuration de partie indiquant un type de chevauchement.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)