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1. (WO2018056180) AUTOMATIC ANALYSIS DEVICE

Pub. No.:    WO/2018/056180    International Application No.:    PCT/JP2017/033331
Publication Date: Fri Mar 30 01:59:59 CEST 2018 International Filing Date: Fri Sep 15 01:59:59 CEST 2017
IPC: G01N 35/00
G01N 35/04
G01N 35/10
Applicants: HITACHI HIGH-TECHNOLOGIES CORPORATION
株式会社日立ハイテクノロジーズ
Inventors: YASUI Akihiro
安居 晃啓
YOSHIDA Gorou
吉田 悟郎
MURAMATSU Yoshiki
村松 由規
YAMAZAKI Isao
山崎 功夫
Title: AUTOMATIC ANALYSIS DEVICE
Abstract:
The present invention is provided with: a storage unit 21b in which parameters optimized for each elevation at which an automatic analysis device 100 is used are stored in correlation with each elevation, the parameters being various types of parameters for the automatic analysis device 100; an input unit 21d for acquiring information of the elevation at which the automatic analysis device 100 is installed; and a control unit 21a for reading a parameter stored in the storage unit 21b on the basis of the elevation acquired by the input unit 21d and setting the parameter in the automatic analysis device 100. The various types of parameters can thereby be easily adjusted in accordance with the usage environment of the device.