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Pub. No.: WO/2018/053774 International Application No.: PCT/CN2016/099800
Publication Date: 29.03.2018 International Filing Date: 23.09.2016
IPC:
G01T 1/24 (2006.01)
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
24
with semiconductor detectors
Applicants: SHENZHEN XPECTVISION TECHNOLOGY CO.,LTD.[CN/CN]; Room 201, Block A, No. 1, Qianwan Road 1, Shenzhen-Hong Kong Cooperative District Shenzhen, Guangdong 518054, CN
Inventors: CAO, Peiyan; CN
LIU, Yurun; CN
Agent: SHENZHEN ARK INTELLECTUAL PROPERTY AGENT LLP; B2011, Jintong Building, No. 1058, Aiguo Road, Luohu Shenzhen, Guangdong 518003, CN
Priority Data:
Title (EN) PACKAGING OF SEMICONDUCTOR X-RAY DETECTORS
(FR) MISE SOUS BOÎTIER DE DÉTECTEURS DE RAYONS X À SEMICONDUCTEURS
Abstract:
(EN) An apparatus suitable for detecting X-ray, comprising: an X-ray absorption layer (110) configured to generate an electrical signal from an X-ray photon incident on the X-ray absorption layer (110); an electronics layer (120) comprising an electronics system (121) configured to process or interpret the electrical signal; wherein at least one of the X-ray absorption layer (110) and the electronics layer (120) is embedded in a board (399) of an electrically insulating material.
(FR) L'invention concerne un appareil adapté pour détecter des rayons X, comprenant : une couche d'absorption de rayons X (110), configurée pour générer un signal électrique à partir d'un photon de rayons X incident sur la couche d'absorption de rayons X (110), et une couche électronique (120), comprenant un système électronique (121) configuré pour traiter ou interpréter le signal électrique. Au moins l'une parmi la couche d'absorption de rayons X (110) et la couche électronique (120) est incorporée dans une carte (399) d'un matériau électriquement isolant.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)