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1. (WO2018052944) TESTING SYSTEM AND METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/052944 International Application No.: PCT/US2017/051281
Publication Date: 22.03.2018 International Filing Date: 13.09.2017
IPC:
G01R 31/28 (2006.01) ,G01R 1/067 (2006.01) ,G01R 31/319 (2006.01) ,G01R 35/00 (2006.01) ,H01L 21/66 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
319
Tester hardware, i.e. output processing circuits
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
35
Testing or calibrating of apparatus covered by the other groups of this subclass
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
21
Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
66
Testing or measuring during manufacture or treatment
Applicants: XCERRA CORPORATION[US/US]; 825 University Avenue Norwood, Massachusetts 02062, US
Inventors: BROWN, Benjamin; US
RANGWALA, Niraj; US
MCCONNELL, David; US
MASSENN, Howard; US
HO, Peter; US
Agent: COLANDREO, Brian J.; US
ABRAMSON, Michael T.; US
PLACKER, Jeffrey T.; US
SARGEANT, Heath M.; US
WHITTENBERGER, Mark H.; US
Priority Data:
62/395,80616.09.2016US
Title (EN) TESTING SYSTEM AND METHOD
(FR) SYSTÈME ET PROCÉDÉ D’ESSAI
Abstract:
(EN) A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and determine if one or more of the plurality of monitored current values exceeds one or more of a plurality of current thresholds.
(FR) L’invention concerne un procédé, un produit programme d'ordinateur, un système informatique et une plateforme d’essai automatisée pour soumettre à un essai au moins un dispositif sous test, ladite plateforme comprenant une tête d’essai conçue pour recevoir ledit au moins un dispositif sous test. Un système de traitement est conçu pour fournir un signal de tension ayant une pluralité de tensions audit au moins un dispositif sous test, surveiller une circulation de courant dans ledit au moins un dispositif sous test au cours de l’application de chacune desdites tensions, générant ainsi une pluralité de valeurs de courant surveillées qui correspondent à la pluralité de tensions, et déterminer si une ou plusieurs desdites valeurs de courant surveillées excède un ou plusieurs seuils parmi une pluralité de seuils de courant.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)