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1. (WO2018047547) MEASUREMENT DEVICE, MICROSCOPE, AND MEASUREMENT METHOD

Pub. No.:    WO/2018/047547    International Application No.:    PCT/JP2017/028417
Publication Date: Fri Mar 16 00:59:59 CET 2018 International Filing Date: Sat Aug 05 01:59:59 CEST 2017
IPC: G01J 1/02
G02B 21/00
Applicants: SCIENCEEDGE INCORPORATED
サイエンスエッジ株式会社
Inventors: OTA Taisuke
太田 泰輔
Title: MEASUREMENT DEVICE, MICROSCOPE, AND MEASUREMENT METHOD
Abstract:
Provided are a measurement device, microscope, and measurement method that make accurate measurement possible. A measurement device according to an embodiment of this invention is provided with a gold nanoparticle (11) that is disposed within or in the vicinity of the focus of a beam of light and scatters the light so as to produce scattered light, a detector (21) for detecting the intensity of the scattered light that has scattered at angles greater than the maximum converging angle at which the focus is formed and is forward scattered light that has scattered forward from the gold nanoparticle (11), and a drive unit for changing the position of the particle relative to the focus.